Issued Patents All Time
Showing 26–50 of 88 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8248607 | Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfaces | Blaine D. Johs, Mathias M. Schubert, Tino Hofmann | 2012-08-21 |
| 8169611 | Terahertz-infrared ellipsometer system, and method of use | Matias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam | 2012-05-01 |
| 8159672 | Sample investigating system and method of use | Martin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Steven E. Green +3 more | 2012-04-17 |
| 8013996 | Spatial filter in sample investigation system | Martin M. Liphardt, Ping He, Blaine D. Johs | 2011-09-06 |
| 7907280 | Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation | Blaine D. Johs, Steven E. Green, Duane E. Meyer, Martin M. Liphardt | 2011-03-15 |
| 7633625 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Ping He, Martin M. Liphardt, Galen L. Pfeiffer | 2009-12-15 |
| 7623237 | Sample investigating system | Martin M. Liphardt, Thomas E. Tiwald, Blaine D. Johs, Jeffrey S. Hale, Steven E. Green +3 more | 2009-11-24 |
| 7616319 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Ping He, Martin M. Liphardt, Galen L. Pfeiffer | 2009-11-10 |
| 7554662 | Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation | Martin M. Liphardt, Ping He, Blaine D. Johs | 2009-06-30 |
| 7522279 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Martin M. Liphardt, Blaine D. Johs, Ping He, Christopher A. Goeden, John A. Woollam +1 more | 2009-04-21 |
| 7508510 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Galen L. Pfeiffer, Martin M. Liphardt, Blaine D. Johs, Christopher A. Goeden, Ping He +2 more | 2009-03-24 |
| 7468794 | Rotating compensator ellipsometer system with spatial filter equivalent | Martin M. Liphardt, Blaine D. Johs, Ping He | 2008-12-23 |
| 7460230 | Deviation angle self compensating substantially achromatic retarder | Blaine D. Johs, Steven E. Green, Duane E. Meyer | 2008-12-02 |
| 7450231 | Deviation angle self compensating substantially achromatic retarder | Blaine D. Johs, Steven E. Green, Duane E. Meyer | 2008-11-11 |
| 7385697 | Sample analysis methodology utilizing electromagnetic radiation | John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki +3 more | 2008-06-10 |
| 7349092 | System for reducing stress induced effects during determination of fluid optical constants | Thomas E. Tiwald, John A. Woollam, Galen L. Pfeiffer, Blaine D. Johs | 2008-03-25 |
| 7336361 | Spectroscopic ellipsometer and polarimeter systems | Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Steven E. Green, Ping He +1 more | 2008-02-26 |
| 7327456 | Spectrophotometer, ellipsometer, polarimeter and the like systems | John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Galen L. Pfeiffer +3 more | 2008-02-05 |
| 7304737 | Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence | Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Steven E. Green, Ping He +1 more | 2007-12-04 |
| 7295313 | Application of intermediate wavelength band spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters | Blaine D. Johs, Jeffrey S. Hale, John A. Woollam | 2007-11-13 |
| 7280194 | Accurate determination of refractive indices of solid, fluid and liquid materials | Steven E. Green, Gregory K. Pribil | 2007-10-09 |
| 7274450 | Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems | Steven E. Green, Ping He, Galen L. Pfeiffer, Brian D. Guenther, Gerald T. Cooney +3 more | 2007-09-25 |
| 7265835 | System for implementing variable retarder capability in ellipsometer, polarimeter or the like systems | Galen L. Pfeiffer | 2007-09-04 |
| 7245376 | Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter | Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Steven E. Green, Ping He +1 more | 2007-07-17 |
| 7239391 | Method of analysis of multiple layer samples | Ronald A. Synowicki | 2007-07-03 |