Issued Patents All Time
Showing 76–88 of 88 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6118537 | Multiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Steven E. Green | 2000-09-12 |
| 6100981 | Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Steven E. Green | 2000-08-08 |
| 6084674 | Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Steven E. Green | 2000-07-04 |
| 6084675 | Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs | 2000-07-04 |
| 6034777 | Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems | Blaine D. Johs | 2000-03-07 |
| 5963327 | Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems | Ping He, Blaine D. Johs | 1999-10-05 |
| 5963325 | Dual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Steven E. Green | 1999-10-05 |
| 5956145 | System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems | Steven E. Green, Blaine D. Johs, John A. Woollam, Stephen P. Ducharme | 1999-09-21 |
| 5946098 | Optical elements for use in spectroscopic ellipsometer and polarimeter systems | Blaine D. Johs, Steven E. Green | 1999-08-31 |
| 5936734 | Analysis of partially polarized electromagnetic radiation in ellipsometer and polarimeter systems | Blaine D. Johs | 1999-08-10 |
| 5835222 | System, and mathematical regression-based method utilizing optical data, for identifying optical axis orientation in material systems such as optical compensators and retarders | — | 1998-11-10 |
| 5796983 | Dielectric function parametric model, and method of use | Blaine D. Johs | 1998-08-18 |
| 5757494 | System and method for improving data acquisition capability in spectroscopic ellipsometers | Steven E. Green, Blaine D. Johs, John A. Woollam | 1998-05-26 |