Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Ishai Schwarzband, Grigory Klebanov +6 more | 2023-05-16 |
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Mor Baram, Doron Girmonsky +1 more | 2022-04-12 |
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Mor Baram, Doron Girmonsky +1 more | 2020-08-18 |
| 10731979 | Method for monitoring nanometric structures | Ishai Schwarzband, Roman Kris | 2020-08-04 |
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2019-07-16 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2018-03-13 |
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2016-12-27 |
| 9165376 | System, method and computer readable medium for detecting edges of a pattern | Ishai Schwartzband, Roman Kris | 2015-10-20 |
| 5628667 | Sinuous toy | — | 1997-05-13 |