YJ

Yun-Jung Jee

Samsung: 12 patents #11,258 of 75,807Top 15%
Overall (All Time): #412,116 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
11043433 Method of inspecting surface and method of manufacturing semiconductor device Sung Yoon Ryu, Chung-Sam Jun, Yu-Sin Yang, Gil-woo Song 2021-06-22
10593032 Defect inspection method and defect inspection apparatus Sung Yoon Ryu, Joon-Seo Song, Yu-Sin Yang, Chung-Sam Jun 2020-03-17
10585115 Scanning probe inspector Duck Mahn Oh, Sung Yoon Ryu, Young-Hoon Sohn, Chung-Sam Jun 2020-03-10
10527556 Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same Min Ho Rim, Jung Soo Kim, Young-Hoon Sohn, Yu-Sin Yang, Chung-Sam Jun 2020-01-07
10281410 Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same Min Ho Rim, Yu-Sin Yang, Chung-Sam Jun 2019-05-07
10249544 Method of inspecting surface and method of manufacturing semiconductor device Sung Yoon Ryu, Chung-Sam Jun, Yu-Sin Yang, Gil-woo Song 2019-04-02
7666069 Wafer holder and wafer conveyor equipped with the same Tae Kyoung Kim, Kyoung-Su Shin, Chung-Sam Jun 2010-02-23
7428328 Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same Chung-Sam Jun, Yu-Sin Yang, Tae Kyoung Kim 2008-09-23
7310140 Method and apparatus for inspecting a wafer surface Tae-Min Eom, Yu-Sin Yang, Chung-Sam Jun, Joung Soo Kim, Moon-kyung Kim +2 more 2007-12-18
7220173 Wafer holder and wafer conveyor system equipped with the same Tae Kyoung Kim, Kyoung-Su Shin, Chung-Sam Jun 2007-05-22
7186280 Method of inspecting a leakage current characteristic of a dielectric layer and apparatus for performing the method Tae-Min Eom, Chung-Sam Jun, Yu-Sin Yang 2007-03-06
7186577 Method for monitoring a density profile of impurities Sun-Yong Choi, Chung-Sam Jun, Kwan-Woo Ryu 2007-03-06