Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Dror Alumot +6 more | 2024-01-02 |
| 11761969 | System and method for analyzing a sample with a dynamic recipe based on iterative experimentation and feedback | Renan Milo, Roie Volkovich, Anna Golotsvan, Nir BenDavid | 2023-09-19 |
| 11454894 | Systems and methods for scatterometric single-wavelength measurement of misregistration and amelioration thereof | Alon Yagil, Yuval Lamhot, Ohad Bachar, Martin Mayo, Roie Volkovich | 2022-09-27 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |