RH

Rafael C. Howell

AB Asml Netherlands B.V.: 22 patents #176 of 3,192Top 6%
Overall (All Time): #187,824 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12210291 Aberration impact systems, models, and manufacturing processes Xingyue PENG, Zhan Shi, Duan-Fu Stephen Hsu, Gerui LIU 2025-01-28
12092963 Method of determining characteristic of patterning process based on defect for reducing hotspot Xingyue PENG, Duan-Fu Stephen Hsu, Qinglin Li 2024-09-17
11977334 Wavefront optimization for tuning scanner based on performance matching Duan-Fu Stephen Hsu, Christoph Rene Konrad Cebulla Hennerkes, Zhan Shi, Xiaoyang Li, Frank Staals 2024-05-07
11972194 Method for determining patterning device pattern based on manufacturability Roshni Biswas, Cuiping Zhang, Ningning Jia, Jingjing Liu, Quan Zhang 2024-04-30
11789371 Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device Yu Cao, Yen-Wen Lu, Peng Liu, Roshni Biswas 2023-10-17
11734490 Method for determining curvilinear patterns for patterning device Quan Zhang, Been-Der Chen, Jing Su, Yi Zou, Yen-Wen Lu 2023-08-22
11614690 Methods of tuning process models Mu FENG, Mir Farrokh SHAYEGAN SALEK, Dianwen ZHU, Leiwu ZHENG, Jen-Shiang Wang 2023-03-28
11586114 Wavefront optimization for tuning scanner based on performance matching Duan-Fu Stephen Hsu, Christoph Hennerkes, Zhan Shi, Xiaoyang Li, Frank Staals 2023-02-21
11580289 Method for determining patterning device pattern based on manufacturability Roshni Biswas, Cuiping Zhang, Ningning Jia, Jingjing Liu, Quan Zhang 2023-02-14
11506984 Simulation of lithography using multiple-sampling of angular distribution of source radiation Duan-Fu Stephen Hsu, Jianjun Jia 2022-11-22
11409203 Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device Yu Cao, Yen-Wen Lu, Peng Liu, Roshni Biswas 2022-08-09
11232249 Method for determining curvilinear patterns for patterning device Quan Zhang, Been-Der Chen, Jing Su, Yi Zou, Yen-Wen Lu 2022-01-25
11054750 Profile aware source-mask optimization Duan-Fu Stephen Hsu, Feng-Liang Liu 2021-07-06
11016395 Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device Yu Cao, Yen-Wen Lu, Peng Liu, Roshni Biswas 2021-05-25
10990003 Binarization method and freeform mask optimization flow Duan-Fu Stephen Hsu, Jingjing Liu, Xingyue PENG 2021-04-27
10558124 Discrete source mask optimization Xiaofeng Liu 2020-02-11
10459346 Flows of optimization for lithographic processes Duan-Fu Stephen Hsu, Xiaofeng Liu 2019-10-29
10401732 Optimization flows of source, mask and projection optics Duan-Fu Stephen Hsu, Luoqi Chen, Hanying Feng, Xinjian Zhou, Yi-Fan Chen 2019-09-03
10191384 Discrete source mask optimization Xiaofeng Liu 2019-01-29
10025201 Flows of optimization for lithographic processes Duan-Fu Stephen Hsu, Xiaofeng Liu 2018-07-17
9588438 Optimization flows of source, mask and projection optics Duan-Fu Stephen Hsu, Luoqi Chen, Hanying Feng, Xinjian Zhou, Yi-Fan Chen 2017-03-07
8898599 Gradient-based pattern and evaluation point selection Xiaofeng Liu 2014-11-25