Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222656 | Method for determining aberration sensitivity of patterns | Jingjing Liu, Duan-Fu Stephen Hsu | 2025-02-11 |
| 12210291 | Aberration impact systems, models, and manufacturing processes | Zhan Shi, Duan-Fu Stephen Hsu, Rafael C. Howell, Gerui LIU | 2025-01-28 |
| 12092963 | Method of determining characteristic of patterning process based on defect for reducing hotspot | Duan-Fu Stephen Hsu, Rafael C. Howell, Qinglin Li | 2024-09-17 |
| 11899374 | Method for determining an electromagnetic field associated with a computational lithography mask model | Jingjing Liu | 2024-02-13 |
| 10990003 | Binarization method and freeform mask optimization flow | Duan-Fu Stephen Hsu, Jingjing Liu, Rafael C. Howell | 2021-04-27 |
| 9446403 | Micro-channel chip | — | 2016-09-20 |
| 9328849 | Microdevice structure of microchannel chip | — | 2016-05-03 |