Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332480 | Identification system | Arpan Dasgupta, Danny Moy | 2025-06-17 |
| 11367734 | Charge trap memory devices | Faraz Khan, Dan Moy, Robert Katz, Darren L. Anand, Toshiaki Kirihata | 2022-06-21 |
| 10685705 | Program and erase memory structures | Faraz Khan, Toshiaki Kirihata, Danny Moy, Darren L. Anand | 2020-06-16 |
| 9658255 | Signal monitoring of through-wafer vias using a multi-layer inductor | Mark A. DiRocco, Kirk D. Peterson, Keith C. Stevens | 2017-05-23 |
| 9372208 | Signal monitoring of through-wafer vias using a multi-layer inductor | Mark A. DiRocco, Kirk D. Peterson, Keith C. Stevens | 2016-06-21 |
| 9194912 | Circuits for self-reconfiguration or intrinsic functional changes of chips before vs. after stacking | Daniel Jacob Fainstein | 2015-11-24 |
| 9029234 | Physical design symmetry and integrated circuits enabling three dimentional (3D) yield optimization for wafer to wafer stacking | John M. Safran, Daniel Jacob Fainstein, Gary W. Maier, Yunsheng Song | 2015-05-12 |
| 8975910 | Through-silicon-via with sacrificial dielectric line | Troy L. Graves-Abe, Benjamin Himmel, Chandrasekharan Kothandaraman | 2015-03-10 |
| 8629049 | Electrically programmable fuse using anisometric contacts and fabrication method | Chandrasekharan Kothandaraman, Dan Moy, John M. Safran | 2014-01-14 |
| 8590010 | Retention based intrinsic fingerprint identification featuring a fuzzy algorithm and a dynamic key | Daniel Jacob Fainstein, Alberto Cestero, Subramanian S. Iyer, Toshiaki Kirihata, Sami Rosenblatt | 2013-11-19 |
| 8569755 | Secure anti-fuse with low voltage programming through localized diffusion heating | Yan Li, Chandrasekharan Kothandaraman, Dan Moy, John M. Safran | 2013-10-29 |
| 8519507 | Electrically programmable fuse using anisometric contacts and fabrication method | Chandrasekharan Kothandaraman, Dan Moy, John M. Safran | 2013-08-27 |
| 8350264 | Secure anti-fuse with low voltage programming through localized diffusion heating | Yan Li, Chandrasekharan Kothandaraman, Dan Moy, John M. Safran | 2013-01-08 |
| 8159040 | Metal gate integration structure and method including metal fuse, anti-fuse and/or resistor | Douglas D. Coolbaugh, Ebenezer E. Eshun, Ephrem G. Gebreselasie, Zhong-Xiang He, Herbert L. Ho +8 more | 2012-04-17 |
| 8004060 | Metal gate compatible electrical antifuse | Deok-kee Kim, Chandrasekharan Kothandaraman, Dan Moy, John M. Safran, Kenneth J. Stein | 2011-08-23 |
| 7111257 | Using a partial metal level mask for early test results | Teresa J. Wu | 2006-09-19 |
| 6957372 | Repair of address-specific leakage | John E. Barth, Jr., Paul C. Parries | 2005-10-18 |
| 6882202 | Multiple trip point fuse latch device and method | Gunther Lehmann | 2005-04-19 |