Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8107975 | Shared image database with geographic navigation | — | 2012-01-31 |
| 7953422 | Shared image database with geographic navigation | — | 2011-05-31 |
| 7933016 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanevsky, Ian Smith, Michael Adel +10 more | 2011-04-26 |
| 7876440 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +1 more | 2011-01-25 |
| 7797019 | Shared image database with geographic navigation | — | 2010-09-14 |
| 7663753 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanevsky, Ian Smith, Michael Adel +10 more | 2010-02-16 |
| 7656528 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman | 2010-02-02 |
| 7564557 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +1 more | 2009-07-21 |
| 7433040 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +3 more | 2008-10-07 |
| 7385699 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +3 more | 2008-06-10 |
| 7379183 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +6 more | 2008-05-27 |
| 7317531 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +10 more | 2008-01-08 |
| 7301634 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +7 more | 2007-11-27 |
| 7298481 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanevsky, Ian Smith, Michael Adel +4 more | 2007-11-20 |
| 7289213 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +1 more | 2007-10-30 |
| 7280212 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +3 more | 2007-10-09 |
| 7277172 | Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals | Daniel Kandel, Kenneth P. Gross, Jiyou Fu, Shakar Krishnan, Boris Golovanevsky | 2007-10-02 |
| 7242477 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Ian Smith, Michael Adel +4 more | 2007-07-10 |