Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8606060 | Method and apparatus for dynamic manipulation and dispersion in photonic crystal devices | Hendrik F. Hamann, Sharee McNab, Yurii A. Vlasov | 2013-12-10 |
| 8518766 | Method of forming switching device having a molybdenum oxynitride metal gate | Nestor A. Bojarczuk, Michael P. Chudzik, Matthew W. Copel, Supratik Guha, Richard A. Haight +2 more | 2013-08-27 |
| 7756667 | Apparatus for three-dimensional measurements of physical characteristics within a data center | Hendrik F. Hamann, Madhusudan K. Iyengar, James A. Lacey, Roger R. Schmidt | 2010-07-13 |
| 7739073 | Method and apparatus for three-dimensional measurements of physical characteristics within a data center | Hendrik F. Hamann, Madhusudan K. Iyengar, James A. Lacey, Roger R. Schmidt | 2010-06-15 |
| 7366632 | Method and apparatus for three-dimensional measurements | Hendrik F. Hamann, Madhusudan K. Iyengar, James A. Lacey, Roger R. Schmidt | 2008-04-29 |
| 7167806 | Method and system for measuring temperature and power distribution of a device | Hendrik F. Hamann, James A. Lacey, Robert J. von Gutfeld, Jamil A. Wakil, Alan J. Weger | 2007-01-23 |
| 7130141 | Assembly for thermal and/or thermally-assisted information processing | S. Jay Chey, Hendrik F. Hamann, H. Kumar Wickramasinghe | 2006-10-31 |
| 7129560 | Thermal memory cell and memory device including the thermal memory cell | Hendrik F. Hamann, H. Kumar Wickramasinghe | 2006-10-31 |
| 7068865 | Method and apparatus for thermo-optic modulation of optical signals | Hendrik F. Hamann, Sharee McNab, Yurii A. Vlasov | 2006-06-27 |
| 6567172 | System and multipass probe for optical interference measurements | Philip Charles Danby Hobbs, Richard J. Lebel, Theodore G. van Kessel, Hemantha K. Wickramasinghe | 2003-05-20 |
| 6334807 | Chemical mechanical polishing in-situ end point system | Richard J. Lebel, Rock Nadeau, Paul Smith, Theodore G. van Kessel, Hemantha K. Wickramasinghe | 2002-01-01 |
| 5646731 | Interferometric detecting/imaging method based on multi-pole sensing | Hemantha K. Wickramasinghe, Frederic Zenhausern, Yves Martin | 1997-07-08 |
| 5640242 | Assembly and method for making in process thin film thickness measurments | John Charles Panner, Thomas E. Sandwick, Theodore G. van Kessel, Hemantha K. Wickramasinghe | 1997-06-17 |
| 5623339 | Interferometric measuring method based on multi-pole sensing | Hemantha K. Wickramasinghe, Frederic Zenhausern | 1997-04-22 |
| 5623338 | Interferometric near-field apparatus based on multi-pole sensing | Hemantha K. Wickramasinghe, Frederic Zenhausern, Yves Martin | 1997-04-22 |
| 5298975 | Combined scanning force microscope and optical metrology tool | Henri A. Khoury, Calvin K. Chi, Joachim Clabes, Philip Charles Danby Hobbs, Laszlo Landstein +2 more | 1994-03-29 |
| 5267471 | Double cantilever sensor for atomic force microscope | David W. Abraham | 1993-12-07 |