Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12123708 | Enhanced cross sectional features measurement methodology | Manoj Kumar Dayyala, Jorge Pablo Fernandez | 2024-10-22 |
| 10347462 | Imaging of crystalline defects | Dror Shemesh, Uri Lev, Benjamin Colombeau, Amir Wachs | 2019-07-09 |
| 8450120 | SEM repair for sub-optimal features | Stuart A. Sieg, Eric P. Solecky | 2013-05-28 |
| 8211717 | SEM repair for sub-optimal features | Stuart A. Sieg, Eric P. Solecky | 2012-07-03 |
| 8111900 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Ramon Ynzunza, Ingrid B. Peterson, Ariel Tribble +3 more | 2012-02-07 |
| 7729529 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Ramon Ynzunza, Ingrid B. Peterson, Ariel Tribble +3 more | 2010-06-01 |
| 7397556 | Method, apparatus, and computer program product for optimizing inspection recipes using programmed defects | Oliver D. Patterson, MaryJane Brodsky | 2008-07-08 |