Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10734827 | Power supply system | — | 2020-08-04 |
| 10446404 | Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus | Ryo Tajima, Masahiro Hatakeyama, Kenichi Suematsu, Kiwamu Tsukamoto, Kenji Watanabe +2 more | 2019-10-15 |
| 10002740 | Inspection device | Masahiro Hatakeyama, Ryo Tajima, Kenichi Suematsu, Kenji Watanabe, Yasushi Toma +1 more | 2018-06-19 |
| 9966227 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Yoshihiko Naito, Norio Kimura, Kenji Watanabe | 2018-05-08 |
| 9852878 | Surface processing apparatus | Masahiro Hatakeyama, Kenichi Suematsu, Ryo Tajima, Kiwamu Tsukamoto, Shoji Yoshikawa | 2017-12-26 |
| 9194826 | Electron beam apparatus and sample observation method using the same | Toru Kaga, Masahiro Hatakeyama, Kenji Watanabe, Yoshihiko Naito, Takeshi Murakami +1 more | 2015-11-24 |
| 9105444 | Electro-optical inspection apparatus and method with dust or particle collection function | Kenji Watanabe, Masahiro Hatakeyama, Yoshihiko Naito, Tatsuya Kohama, Takeshi Murakami +4 more | 2015-08-11 |
| 8937283 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Yoshihiko Naito, Norio Kimura, Kenji Watanabe | 2015-01-20 |
| 8859984 | Method and apparatus for inspecting sample surface | Nobuharu Noji, Yoshihiko Naito, Hirosi Sobukawa, Masahiro Hatakeyama, Katsuya Okumura | 2014-10-14 |
| 8624182 | Electro-optical inspection apparatus and method with dust or particle collection function | Kenji Watanabe, Masahiro Hatakeyama, Yoshihiko Naito, Tatsuya Kohama, Takeshi Murakami +4 more | 2014-01-07 |
| 8525127 | Method and apparatus for inspecting sample surface | Nobuharu Noji, Yoshihiko Naito, Hirosi Sobukawa, Masahiro Hatakeyama, Katsuya Okumura | 2013-09-03 |
| 8274047 | Substrate surface inspection method and inspection apparatus | Yoshihiko Naito, Norio Kimura, Masahiro Hatakeyama, Masamitsu Itoh | 2012-09-25 |
| 8148924 | Electrical motor load controller and control methods therefor | Yoshihiro Ohkuwa, Shigeyuki Kido, Naoki Matsushita | 2012-04-03 |
| 7952071 | Apparatus and method for inspecting sample surface | Nobuharu Noji, Yoshihiko Naito, Hirosi Sobukawa, Masahiro Hatakeyama, Takeshi Murakami +2 more | 2011-05-31 |
| 7829853 | Sample surface observation method | Kenji Watanabe, Masahiro Hatakeyama, Yoshihiko Naito | 2010-11-09 |
| 7496163 | AGC system, AGC method, and receiver using the AGC system | — | 2009-02-24 |
| 7366263 | Radio communication terminal and radio signal receiving method | — | 2008-04-29 |
| 7256405 | Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same method | Mamoru Nakasuji, Takao Kato, Tohru Satake, Takeshi Murakami, Nobuharu Noji | 2007-08-14 |
| 7254162 | CDMA receiver performing a path search, path search method, and program therefor | — | 2007-08-07 |
| 7039097 | CDMA receiver, path search method and program | — | 2006-05-02 |
| 6663710 | Method for continuously pulling up crystal | Kentaro Fujita, Hideyuki Isozaki, Iwao Satoh | 2003-12-16 |
| 6471768 | Method of and apparatus for growing ribbon of crystal | Hideyuki Isozaki, Taro Takahashi, Motohiro Niijima | 2002-10-29 |
| 5539538 | Facsimile machine having a single feeding path for document and recording sheet | — | 1996-07-23 |