Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12243710 | Electron beam irradiation apparatus with overlapping beam columns and helping columns | — | 2025-03-04 |
| 11515118 | Electron beam irradiation apparatus and electron beam alignment method | Kenji Watanabe, Shinichi Okada, Tsutomu Karimata | 2022-11-29 |
| 11217421 | Adjustment method and electron beam device | Takehide Hayashi, Tatsuya Kohama, Kenji Watanabe, Tsutomu Karimata | 2022-01-04 |
| 10707048 | Deflection sensitivity calculation method and deflection sensitivity calculation system | — | 2020-07-07 |
| 10446404 | Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus | Masahiro Hatakeyama, Kenichi Suematsu, Kiwamu Tsukamoto, Kenji Watanabe, Shoji Yoshikawa +2 more | 2019-10-15 |
| 10002740 | Inspection device | Masahiro Hatakeyama, Kenichi Suematsu, Kenji Watanabe, Yasushi Toma, Kenji Terao +1 more | 2018-06-19 |
| 9852878 | Surface processing apparatus | Masahiro Hatakeyama, Kenichi Suematsu, Kiwamu Tsukamoto, Kenji Terao, Shoji Yoshikawa | 2017-12-26 |
| 9406480 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2016-08-02 |
| 9105445 | Inspection system, inspection image data generation method, inspection display unit, defect determination method, and storage medium on which inspection display program is recorded | Kenichi Suematsu, Shoji Yoshikawa | 2015-08-11 |
| 8946631 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2015-02-03 |
| 8742341 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2014-06-03 |
| 8256362 | Embroidery sewing machine and control method therefor | Shoji Kato | 2012-09-04 |
| 8013315 | Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same | Kenji Watanabe, Takeshi Murakami, Masahiro Hatakeyama, Masatoshi Tsuneoka, Nobuharu Noji | 2011-09-06 |
| 7934461 | Sewing machine capable of sewing sequins and method for setting sequin feed amount therefor | — | 2011-05-03 |
| 7741601 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2010-06-22 |
| 7365324 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2008-04-29 |
| 7138629 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2006-11-21 |