FI

Fumikazu Itoh

HI Hitachi: 20 patents #1,757 of 28,497Top 7%
Overall (All Time): #226,075 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
6753253 Method of making wiring and logic corrections on a semiconductor device by use of focused ion beams Takahiko Takahashi, Akira Shimase, Mikio Hongo, Satoshi Haraichi, Hiroshi Yamaguchi 2004-06-22
5825035 Processing method and apparatus using focused ion beam generating means Michinobu Mizumura, Yuuichi Hamamura, Junzou Azuma, Akira Shimase, Takashi Kamimura +3 more 1998-10-20
5683547 Processing method and apparatus using focused energy beam Junzou Azuma, Satoshi Haraichi, Akira Shimase, Junichi Mori, Takahiko Takahashi +1 more 1997-11-04
5656811 Method for making specimen and apparatus thereof Toshihiko Nakata, Tohru Ishitani, Akira Shimase, Hiroshi Yamaguchi, Takashi Kamimura 1997-08-12
5583344 Process method and apparatus using focused ion beam generating means Michinobu Mizumura, Yuuichi Hamamura, Junzou Azuma, Akira Shimase, Takashi Kamimura +3 more 1996-12-10
5504340 Process method and apparatus using focused ion beam generating means Michinobu Mizumura, Yuuichi Hamamura, Junzou Azuma, Akira Shimase, Takashi Kamimura +3 more 1996-04-02
5447614 Method of processing a sample using a charged beam and reactive gases and system employing the same Yuuichi Hamamura, Satoshi Haraichi, Akira Shimase, Junzou Azuma, Toshio Yamada +2 more 1995-09-05
5439763 Optical mask and method of correcting the same Akira Shimase, Junzou Azuma, Satoshi Haraichi, Yasuhiro Koizumi 1995-08-08
5358806 Phase shift mask, method of correcting the same and apparatus for carrying out the method Satoshi Haraichi, Akira Shimase, Hiroshi Yamaguchi, Junzou Azuma, Yasuhiro Koizumi 1994-10-25
5342448 Apparatus for processing a sample using a charged beam and reactive gases Yuuichi Hamamura, Satoshi Haraichi, Akira Shimase, Junzou Azuma, Toshio Yamada +2 more 1994-08-30
5229607 Combination apparatus having a scanning electron microscope therein Hironobu Matsui, Mikio Ichihashi, Sumio Hosaka, Yoshinori Nakayama, Satoshi Haraichi +9 more 1993-07-20
5223109 Ion beam processing method and apparatus Akira Shimase, Satoshi Haraichi, Junzou Azuma 1993-06-29
5113072 Device having superlattice structure, and method of and apparatus for manufacturing the same Hiroshi Yamaguchi, Keiya Saito, Koji Ishida, Shinji Sakano, Masao Tamura +3 more 1992-05-12
5086015 Method of etching a semiconductor device by an ion beam Akira Shimase, Satoshi Haraichi, Takahiko Takahashi, Mikio Hongo 1992-02-04
5055696 Multilayered device micro etching method and system Satoshi Haraichi, Akira Shimase, Takahiko Takahashi 1991-10-08
5026664 Method of providing a semiconductor IC device with an additional conduction path Mikio Hongo, Katsuro Mizukoshi, Shuzo Sano, Takashi Kamimura, Akira Shimase +2 more 1991-06-25
4983540 Method of manufacturing devices having superlattice structures Hiroshi Yamaguchi, Keiya Saito, Koji Ishida, Shinji Sakano, Masao Tamura +3 more 1991-01-08
4449293 Coil winding and inserting machine Yasuhiro Fujita, Takashi Kobayashi, Takao Mifune 1984-05-22
4299023 Machine for winding and inserting coils Minoru Tanaka, Hiroshi Saitoh, Takashi Kobayashi, Akiyoshi Sasaki, Norio Akutsu 1981-11-10
4184644 Winding machine Mitsuo Sato, Nobu Kamita, Takashi Kobayashi, Noboru Sugimoto 1980-01-22