| 11438376 |
Problematic autonomous system routing detection |
— |
2022-09-06 |
| 8423918 |
Structure and methodology for fabrication and inspection of photomasks by a single design system |
Jed H. Rankin |
2013-04-16 |
| 8181009 |
VLAN tagging over IPSec tunnels |
Bruce Wayne Yancy |
2012-05-15 |
| 7745069 |
Structure and methodology for fabrication and inspection of photomasks |
Jed H. Rankin |
2010-06-29 |
| 7294440 |
Method to selectively correct critical dimension errors in the semiconductor industry |
Jed H. Rankin |
2007-11-13 |
| 7276316 |
Common second level frame exposure methods for making embedded attenuated phase shift masks |
— |
2007-10-02 |
| 7211356 |
Method of patterning a substrate by feeding mask defect data forward for subsequent correction |
Jed H. Rankin |
2007-05-01 |
| 7200257 |
Structure and methodology for fabrication and inspection of photomasks |
Jed H. Rankin |
2007-04-03 |
| 7110195 |
Monolithic hard pellicle |
Emily Gallagher, Rogert K. Leidy, Michael Lercel, Kenneth Racette |
2006-09-19 |
| 6557163 |
Method of photolithographic critical dimension control by using reticle measurements in a control algorithm |
Jed H. Rankin, Craig E. Schneider, John S. Smyth |
2003-04-29 |
| 6387596 |
Method of forming resist images by periodic pattern removal |
Daniel C. Cole, Edward W. Conrad, David V. Horak, Randy W. Mann, Paul W. Pastel +1 more |
2002-05-14 |
| 6338921 |
Mask with linewidth compensation and method of making same |
James A. Bruce, David V. Horak, Randy W. Mann, Jed H. Rankin |
2002-01-15 |
| 5334467 |
Gray level mask |
John Cronin, Paul A. Farrar, Carter W. Kaanta, James G. Ryan |
1994-08-02 |
| 5213916 |
Method of making a gray level mask |
John Cronin, Paul A. Farrar, Carter W. Kaanta, James G. Ryan |
1993-05-25 |
| 5126006 |
Plural level chip masking |
John Cronin, Paul A. Farrar, Robert M. Geffken, William H. Guthrie, Carter W. Kaanta +3 more |
1992-06-30 |
| 4838323 |
Misfuelling prevention device and method |
— |
1989-06-13 |
