Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11177048 | Method and system for evaluating objects | Igor Krivts (Krayvitz), Efim Vinnitsky, Yoram Uziel, Ron Naftali | 2021-11-16 |
| 11047677 | X-ray based metrology of a high aspect ratio hole | — | 2021-06-29 |
| 10068748 | Scanning an object using multiple mechanical stages | Yoram Uziel, Doron Aspir, Yohanan Madmon, Ron Naftali, Yuri Belenky | 2018-09-04 |
| 9847209 | Inspection of regions of interest using an electron beam system | Alon Litman | 2017-12-19 |
| 9666412 | Method for charging and imaging an object | Alon Litman, Yoram Uziel | 2017-05-30 |
| 9490101 | System and method for scanning an object | Yuval Gronau, Ishai Schwarzband, Dror Shemesh, Ran Schleyen, Ofir Greenberg | 2016-11-08 |
| 9466462 | Inspection of regions of interest using an electron beam system | Alon Litman | 2016-10-11 |
| 8207499 | Variable rate scanning in an electron microscope | Amir Shoham, Alon Litman | 2012-06-26 |
| 7535001 | Method and system for focusing a charged particle beam | — | 2009-05-19 |
| 7375326 | Method and system for focusing a charged particle beam | — | 2008-05-20 |
| 7285779 | Methods of scanning an object that includes multiple regions of interest using an array of scanning beams | Alon Litman | 2007-10-23 |
| 7235794 | System and method for inspecting charged particle responsive resist | Ophir Dror, Guy Eytan | 2007-06-26 |