Issued Patents All Time
Showing 25 most recent of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10247624 | Self-calibrated thermal sensors of an integrated circuit die | Mohamed A. Abdelmoneum, David E. Duarte | 2019-04-02 |
| 9702769 | Self-calibrated thermal sensors of an integrated circuit die | Mohamed A. Abdelmoneum, David E. Duarte | 2017-07-11 |
| 8827550 | Thermal sensor using a vibrating MEMS resonator of a chip interconnect layer | Mohamed A. Abdelmoneum, Tawfik M. Rahal-Arabi, Kevin J. Fischer, Andrew W. Yeoh | 2014-09-09 |
| 8331186 | Fuse programming schemes for robust yield | Jun He, Zhanping Chen, Jeffrey Hicks | 2012-12-11 |
| 8314725 | On-die digital-to-analog conversion testing | Paola Zepeda, David E. Duarte, Atul Maheshwari | 2012-11-20 |
| 7889587 | Fuse programming schemes for robust yield | Jun He, Zhanping Chen, Jeffrey Hicks | 2011-02-15 |
| 7602663 | Fuse cell array with redundancy features | Zhanping Chen, Jonathan P. Douglas, Praveen Mosalikanti, Kevin X. Zhang | 2009-10-13 |
| 7501845 | On-chip frequency degradation compensation | Ravisangar Muniandy, Payman Aminzadeh | 2009-03-10 |
| 7417459 | On-die offset reference circuit block | Timothy M. Wilson, Songmin Kim | 2008-08-26 |
| 7394274 | On-chip frequency degradation compensation | Ravisangar Muniandy, Payman Aminzadeh | 2008-07-01 |
| 7348790 | AC testing of leakage current in integrated circuits using RC time constant | Tawfik Arabi, Srirama Pedarla, Patrick Elwer, Dan Murray | 2008-03-25 |
| 7282937 | On-chip frequency degradation compensation | Ravisangar Muniandy, Payman Aminzadeh | 2007-10-16 |
| 7233162 | Arrangements having IC voltage and thermal resistance designated on a per IC basis | Tawfik Arabi, Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld | 2007-06-19 |
| 7199624 | Phase locked loop system capable of deskewing | Keng L. Wong, Chee How Lim | 2007-04-03 |
| 7112979 | Testing arrangement to distribute integrated circuits | Tawfik Arabi, Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld | 2006-09-26 |
| 7109737 | Arrangements having IC voltage and thermal resistance designated on a per IC basis | Tawfik Arabi, Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld | 2006-09-19 |
| 7049865 | Power-on detect circuit for use with multiple voltage domains | Rachael Parker, Mark L. Neidengard, Patrick J. Ott | 2006-05-23 |
| 6967496 | AC testing of leakage current in integrated circuits using RC time constant | Tawfik Arabi, Srirama Pedaria, Patrick Elwer, Dan Murray | 2005-11-22 |
| 6885231 | Variable delay element for use in delay tuning of integrated circuits | Ravishankar Kuppuswamy | 2005-04-26 |
| 6874083 | Method and apparatus to ensure proper voltage and frequency configuration signals are defined before applying power to processor | Ananda Sarangi, Rachael Parker, Edward P. Osburn | 2005-03-29 |
| 6792489 | Multistage configuration and power setting | Edward P. Osburn, Ananda Sarangi | 2004-09-14 |
| 6781428 | Input circuit with switched reference signals | Chi-Yeu Chao | 2004-08-24 |
| 6777970 | AC testing of leakage current in integrated circuits using RC time constant | Tawfik Arabi, Srirama Pedarla, Patrick Elwer, Dan Murray | 2004-08-17 |
| 6748549 | Clocking an I/O buffer, having a selectable phase difference from the system clock, to and from a remote I/O buffer clocked in phase with the system clock | Chi-Yeu Chao, Chee How Lim, Keng L. Wong, Songmin Kim | 2004-06-08 |
| 6727597 | Integrated circuit device having C4 and wire bond connections | George L. Geannopoulos | 2004-04-27 |