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Dark bits to reduce physically unclonable function error rates |
Kevin C. Gotze, David Johnston, Patrick Koeberl, Jiangtao Li, Wei Wu |
2018-06-05 |
| 9742563 |
Secure provisioning of secret keys during integrated circuit manufacturing |
Kevin C. Gotze, Jiangtao Li |
2017-08-22 |
| 8928347 |
Integrated circuits having accessible and inaccessible physically unclonable functions |
Kevin C. Gotze, Jiangtao Li, David Johnston, Sanu K. Mathew, George W. Cox +1 more |
2015-01-06 |
| 8885819 |
Fuse attestation to secure the provisioning of secret keys during integrated circuit manufacturing |
Kevin C. Gotze, Jiangtao Li |
2014-11-11 |
| 7233162 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis |
Tawfik Arabi, Hung-Piao Ma, Shai Rotem, Avner Kornfeld, Gregory F. Taylor |
2007-06-19 |
| 7231552 |
Method and apparatus for independent control of devices under test connected in parallel |
Rachael Parker |
2007-06-12 |
| 7117114 |
On-die temperature control data for communicating to a thermal actuator |
Tawfik Arabi, Hung-Piao Ma, Benson D. Inkley, Stephen H. Gunther, Matthew C. Reilly |
2006-10-03 |
| 7112979 |
Testing arrangement to distribute integrated circuits |
Tawfik Arabi, Hung-Piao Ma, Shai Rotem, Avner Kornfeld, Gregory F. Taylor |
2006-09-26 |
| 7109737 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis |
Tawfik Arabi, Hung-Piao Ma, Shai Rotem, Avner Kornfeld, Gregory F. Taylor |
2006-09-19 |