| 8461895 |
Per die temperature programming for thermally efficient integrated circuit (IC) operation |
Ali Muhtaroglu |
2013-06-11 |
| 8044697 |
Per die temperature programming for thermally efficient integrated circuit (IC) operation |
Ali Muhtaroglu |
2011-10-25 |
| 7685445 |
Per die voltage programming for energy efficient integrated circuit (IC) operation |
Ali Muhtaroglu, Michael Bitan |
2010-03-23 |
| 7348790 |
AC testing of leakage current in integrated circuits using RC time constant |
Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray |
2008-03-25 |
| 7233162 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis |
Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor |
2007-06-19 |
| 7157924 |
Method and apparatus for on-die voltage fluctuation detection |
Ali Muhtaroglu, Kent R. Callahan, Greg Taylor |
2007-01-02 |
| 7117114 |
On-die temperature control data for communicating to a thermal actuator |
Hung-Piao Ma, Benson D. Inkley, Gregory M. Iovino, Stephen H. Gunther, Matthew C. Reilly |
2006-10-03 |
| 7112979 |
Testing arrangement to distribute integrated circuits |
Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor |
2006-09-26 |
| 7109737 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis |
Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor |
2006-09-19 |
| 6967496 |
AC testing of leakage current in integrated circuits using RC time constant |
Gregory F. Taylor, Srirama Pedaria, Patrick Elwer, Dan Murray |
2005-11-22 |
| 6777970 |
AC testing of leakage current in integrated circuits using RC time constant |
Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray |
2004-08-17 |
| 6747470 |
Method and apparatus for on-die voltage fluctuation detection |
Ali Muhtaroglu, Kent R. Callahan, Greg Taylor |
2004-06-08 |
| 6671847 |
I/O device testing method and apparatus |
Chi-Yeu Chao, Thomas D. Barrett, Gregory F. Taylor |
2003-12-30 |
| 6449742 |
Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface |
Dave Riendeau, Srirama Pedarla, Greg Eberlein, Gary A. Andrew |
2002-09-10 |