Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8461895 | Per die temperature programming for thermally efficient integrated circuit (IC) operation | Ali Muhtaroglu | 2013-06-11 |
| 8044697 | Per die temperature programming for thermally efficient integrated circuit (IC) operation | Ali Muhtaroglu | 2011-10-25 |
| 7685445 | Per die voltage programming for energy efficient integrated circuit (IC) operation | Ali Muhtaroglu, Michael Bitan | 2010-03-23 |
| 7348790 | AC testing of leakage current in integrated circuits using RC time constant | Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray | 2008-03-25 |
| 7233162 | Arrangements having IC voltage and thermal resistance designated on a per IC basis | Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor | 2007-06-19 |
| 7157924 | Method and apparatus for on-die voltage fluctuation detection | Ali Muhtaroglu, Kent R. Callahan, Greg Taylor | 2007-01-02 |
| 7117114 | On-die temperature control data for communicating to a thermal actuator | Hung-Piao Ma, Benson D. Inkley, Gregory M. Iovino, Stephen H. Gunther, Matthew C. Reilly | 2006-10-03 |
| 7112979 | Testing arrangement to distribute integrated circuits | Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor | 2006-09-26 |
| 7109737 | Arrangements having IC voltage and thermal resistance designated on a per IC basis | Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor | 2006-09-19 |
| 6967496 | AC testing of leakage current in integrated circuits using RC time constant | Gregory F. Taylor, Srirama Pedaria, Patrick Elwer, Dan Murray | 2005-11-22 |
| 6777970 | AC testing of leakage current in integrated circuits using RC time constant | Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray | 2004-08-17 |
| 6747470 | Method and apparatus for on-die voltage fluctuation detection | Ali Muhtaroglu, Kent R. Callahan, Greg Taylor | 2004-06-08 |
| 6671847 | I/O device testing method and apparatus | Chi-Yeu Chao, Thomas D. Barrett, Gregory F. Taylor | 2003-12-30 |
| 6449742 | Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface | Dave Riendeau, Srirama Pedarla, Greg Eberlein, Gary A. Andrew | 2002-09-10 |