Tawfik Arabi — 14 Patents at Intel

Tawfik Arabi has been granted 14 US patents while listed as an inventor at Intel. The first was granted in 2002 and the most recent in June 2013. Tawfik Arabi ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Tawfik Arabi in Tigard, OR, US.

Patents per Year

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Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8461895	Per die temperature programming for thermally efficient integrated circuit (IC) operation	Ali Muhtaroglu	2013-06-11	$12,060,000
8044697	Per die temperature programming for thermally efficient integrated circuit (IC) operation	Ali Muhtaroglu	2011-10-25	$38,824,000
7685445	Per die voltage programming for energy efficient integrated circuit (IC) operation	Ali Muhtaroglu, Michael Bitan	2010-03-23	$13,395,000
7348790	AC testing of leakage current in integrated circuits using RC time constant	Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray	2008-03-25	$11,219,000
7233162	Arrangements having IC voltage and thermal resistance designated on a per IC basis	Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor	2007-06-19	$30,093,000
7157924	Method and apparatus for on-die voltage fluctuation detection	Ali Muhtaroglu, Kent R. Callahan, Greg Taylor	2007-01-02
7117114	On-die temperature control data for communicating to a thermal actuator	Hung-Piao Ma, Benson D. Inkley, Gregory M. Iovino, Stephen H. Gunther, Matthew C. Reilly	2006-10-03	$14,661,000
7112979	Testing arrangement to distribute integrated circuits	Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor	2006-09-26	$21,238,000
7109737	Arrangements having IC voltage and thermal resistance designated on a per IC basis	Hung-Piao Ma, Gregory M. Iovino, Shai Rotem, Avner Kornfeld, Gregory F. Taylor	2006-09-19	$12,802,000
6967496	AC testing of leakage current in integrated circuits using RC time constant	Gregory F. Taylor, Srirama Pedaria, Patrick Elwer, Dan Murray	2005-11-22	$36,161,000
6777970	AC testing of leakage current in integrated circuits using RC time constant	Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray	2004-08-17	$19,443,000
6747470	Method and apparatus for on-die voltage fluctuation detection	Ali Muhtaroglu, Kent R. Callahan, Greg Taylor	2004-06-08	$20,315,000
6671847	I/O device testing method and apparatus	Chi-Yeu Chao, Thomas D. Barrett, Gregory F. Taylor	2003-12-30	$55,813,000
6449742	Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface	Dave Riendeau, Srirama Pedarla, Greg Eberlein, Gary A. Andrew	2002-09-10	$32,074,000

Tawfik Arabi — 14 Patents

Patents per Year

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