Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › AC testing of leakage current in integrated circuits using RC time constant

AC testing of leakage current in integrated circuits using RC time constant

US Patent 6967496 · Granted Nov 22, 2005

Estimated economic value: $36,161,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Self-calibrated thermal sensors of an integrated circuit die2019
Self-calibrated thermal sensors of an integrated circuit die2017
Dispenser lid and container including the same2015
Dispenser lid and container including the same2014
Thermal sensor using a vibrating MEMS resonator of a chip interconnect layer2014
Per die temperature programming for thermally efficient integrated circuit (IC) 2013
Dispenser lid with biasing pin and container including the same2013
Fuse programming schemes for robust yield2012
On-die digital-to-analog conversion testing2012
Dispenser lid including a secondary lid and container including the same2012
Per die temperature programming for thermally efficient integrated circuit (IC) 2011
Fuse programming schemes for robust yield2011