Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7348790 | AC testing of leakage current in integrated circuits using RC time constant | Tawfik Arabi, Gregory F. Taylor, Patrick Elwer, Dan Murray | 2008-03-25 |
| 6777970 | AC testing of leakage current in integrated circuits using RC time constant | Tawfik Arabi, Gregory F. Taylor, Patrick Elwer, Dan Murray | 2004-08-17 |
| 6449742 | Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface | Tawfik Arabi, Dave Riendeau, Greg Eberlein, Gary A. Andrew | 2002-09-10 |