Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12292469 | Current measuring circuit | Christian Djelassi-Tscheck, Cristian Mihai Boianceanu | 2025-05-06 |
| 11443990 | Prognostic health management for power devices | Sergio De Gasperi, Alexander Mayer, Dieter Haerle, Andrea Baschirotto | 2022-09-13 |
| 11276624 | Semiconductor device power metallization layer with stress-relieving heat sink structure | Heiko Assmann, Olaf Heitzsch, Jakob Kriz, Sven Lanzerstorfer, Rainer Pelzer +3 more | 2022-03-15 |
| 11171049 | Semiconductor device and a method of forming the semiconductor device | Werner Robl, Michael Fugger, Carsten Schaeffer, Klemens Pruegl | 2021-11-09 |
| 11127693 | Barrier for power metallization in semiconductor devices | Johann Gatterbauer, Katrin Albers, Joerg Busch, Klaus Goller, Norbert Mais +3 more | 2021-09-21 |
| 10978395 | Method of manufacturing a semiconductor device having a power metallization structure | Ravi Keshav Joshi, Rainer Pelzer, Axel Bürke, Sven Schmidbauer | 2021-04-13 |
| 10937720 | Semiconductor device with copper structure | Silvia Larisegger, Sabine Reither | 2021-03-02 |
| 10734320 | Power metallization structure for semiconductor devices | Ravi Keshav Joshi, Rainer Pelzer, Axel Buerke, Sven Schmidbauer | 2020-08-04 |
| 10700019 | Semiconductor device with compressive interlayer | Marianne Mataln, Rainer Pelzer, Bernhard Weidgans | 2020-06-30 |
| 10446469 | Semiconductor device having a copper element and method of forming a semiconductor device having a copper element | Thomas Detzel, Johann Gross, Robert Illing, Maximilian Krug, Sven Lanzerstorfer +3 more | 2019-10-15 |
| 10396067 | Semiconductor device having a load current component and a sensor component | Stefan Decker, Robert Illing | 2019-08-27 |
| 10332793 | Self-organizing barrier layer disposed between a metallization layer and a semiconductor region | Werner Robl, Michael Fugger, Carsten Schaeffer, Klemens Pruegl | 2019-06-25 |
| 10304782 | Compressive interlayer having a defined crack-stop edge extension | Marianne Mataln, Rainer Pelzer, Bernhard Weidgans | 2019-05-28 |
| 10249612 | Semiconductor device including self-protecting current sensor | Stefan Decker, Robert Illing | 2019-04-02 |
| 9812376 | Electrically conductive element, power semiconductor device having an electrically conductive element and method of manufacturing a power semiconductor device | Stefan Woehlert, Siegfried Roehl | 2017-11-07 |
| 9523729 | Apparatus and method for testing electric conductors | Bernhard Zagar, Achim Osterloh, Petar Fanic | 2016-12-20 |
| 9418937 | Integrated circuit and method of forming an integrated circuit | Thomas Detzel, Johann Gross, Robert Illing, Maximilian Krug, Sven Lanzerstorfer +3 more | 2016-08-16 |
| 8502274 | Integrated circuit including power transistor cells and a connecting line | Kurt Matoy, Thomas Detzel, Arno Zechmann, Stefan Decker, Robert Illing +4 more | 2013-08-06 |