Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Todd C. Bailey — 32 Patents

IBM: 15 patents #7,470 of 70,183Top 15%
University Of Texas System: 14 patents #114 of 6,559Top 2%
Infineon Technologies Ag: 4 patents #2,109 of 7,486Top 30%
FSFreeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Poughkeepsie, NY: #123 of 1,613 inventorsTop 8%
New York: #3,705 of 115,490 inventorsTop 4%
Overall (All Time): #110,428 of 4,157,543Top 3%
32 Patents All Time
Todd C. Bailey has been granted 32 US patents while listed as an inventor at IBM. The first was granted in 2004 and the most recent in February 2019. Todd C. Bailey ranks #110,428 of 4,157,543 US inventors in our database (top 2.7%). Patent records list Todd C. Bailey in Poughkeepsie, NY, US.

Issued Patents All Time

Showing 1–25 of 32 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10210292 Process-metrology reproducibility bands for lithographic photomasks Ioana Graur, Scott D. Halle, Marshal A. Miller 2019-02-19 $3,019,000
9928316 Process-metrology reproducibility bands for lithographic photomasks Ioana Graur, Scott D. Halle, Marshal A. Miller 2018-03-27 $2,459,000
9223202 Method of automatic fluid dispensing for imprint lithography processes Byung-Jin Choi, Sidlgata V. Sreenivasan, Carlton G. Willson, Mattherw E. Colburn, John Ekerdt 2015-12-29
8514374 Alignment method for semiconductor processing William Chu, William A. Muth 2013-08-20 $3,918,000
8491984 Structure resulting from chemical shrink process over BARC (bottom anti-reflective coating) Colin J. Brodsky, Allen H. Gabor 2013-07-23 $2,085,000
8495527 Pattern recognition with edge correction for design based metrology Daniel S. Fischer, Dongbing Shao 2013-07-23 $2,085,000
8429570 Pattern recognition with edge correction for design based metrology Daniel S. Fischer, Dongbing Shao 2013-04-23 $7,839,000
8415212 Method of enhancing photoresist adhesion to rare earth oxides James K. Schaeffer, Eric D. Luckowski, Amy L. Child, Daniel Jaeger, Renee T. Mo +1 more 2013-04-09 $3,391,000
8359562 System and method for semiconductor device fabrication using modeling Chandrasekhar Sarma 2013-01-22 $9,574,000
8330937 Stray light feedback for dose control in semiconductor lithography systems Sajan Marokkey, Wai-Kin Li 2012-12-11 $5,394,000
8110496 Method for performing chemical shrink process over BARC (bottom anti-reflective coating) Colin J. Brodsky, Allen H. Gabor 2012-02-07 $8,176,000
8033814 Device for holding a template for use in imprint lithography Byung-Jin Choi, Matthew E. Colburn, Sidlgata V. Sreenivasan, Carlton G. Willson, John Ekerdt 2011-10-11
7998871 Mask forming and implanting methods using implant stopping layer Katherina Babich, Richard A. Conti, Ryan P. Deschner 2011-08-16 $4,692,000
7926006 Variable fill and cheese for mitigation of BEOL topography Ryan P. Deschner, Wai-Kin Li, Roger A. Quon 2011-04-12 $5,593,000
7708542 Device for holding a template for use in imprint lithography Byung-Jin Choi, Matthew E. Colburn, Sidlgata V. Sreenivasan, Carlton G. Willson, John Ekerdt 2010-05-04
7651947 Mask forming and implanting methods using implant stopping layer and mask so formed Katherina Babich, Richard A. Conti, Ryan P. Deschner 2010-01-26 $13,842,000
7583362 Stray light feedback for dose control in semiconductor lithography systems Sajan Marokkey, Wai-Kin Li 2009-09-01
7514356 Ribs for line collapse prevention in damascene structures Sajan Marokkey, O Seo Park, Wai-Kin Li 2009-04-07
7303383 Imprint lithography system to produce light to impinge upon and polymerize a liquid in superimposition with template overlay marks Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2007-12-04
7288478 Method for performing chemical shrink process over BARC (bottom anti-reflective coating) Colin J. Brodsky, Allen H. Gabor 2007-10-30 $4,304,000
7229273 Imprint lithography template having a feature size under 250 nm Byung-Jin Choi, Matthew E. Colburn, Sidlgata V. Sreenivasan, Carlton G. Willson, John Ekerdt 2007-06-12
7186483 Method of determining alignment of a template and a substrate having a liquid disposed therebetween Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2007-03-06
7083898 Method for performing chemical shrink process over BARC (bottom anti-reflective coating) Colin J. Brodsky, Allen H. Gabor 2006-08-01 $2,070,000
7060324 Method of creating a dispersion of a liquid on a substrate Byung-Jin Choi, Matthew E. Colburn, Sidlgata V. Sreenivasan, C. Grant Willson, John Ekerdt 2006-06-13
6986975 Method of aligning a template with a substrate employing moire patterns Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2006-01-17