SM

Sajan Marokkey

Infineon Technologies Ag: 20 patents #423 of 7,486Top 6%
IBM: 2 patents #32,839 of 70,183Top 50%
📍 Wappingers Falls, NY: #95 of 884 inventorsTop 15%
🗺 New York: #6,964 of 115,490 inventorsTop 7%
Overall (All Time): #224,414 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
8828748 Test structures and methods 2014-09-09
8715909 Lithography systems and methods of manufacturing using thereof Alois Gutmann, Henning Haffner, Chandrasekhar Sarma, Roderick Koehle 2014-05-06
8518820 Methods for forming contacts in semiconductor devices Roberto Schiwon, Klaus Herold, Jenny Lian, Martin Ostermayr 2013-08-27
8450122 Test structures and methods 2013-05-28
8377800 Alignment marks for polarized light lithography and method for use thereof Chandrasekhar Sarma, Alois Gutmann 2013-02-19
8330937 Stray light feedback for dose control in semiconductor lithography systems Wai-Kin Li, Todd C. Bailey 2012-12-11
8203223 Overlay target for polarized light lithography 2012-06-19
8183129 Alignment marks for polarized light lithography and method for use thereof Chandrasekhar Sarma, Alois Gutmann 2012-05-22
8071261 Lithography masks and methods of manufacture thereof Alois Gutmann, Henning Haffner, Chandrasekhar Sarma, Haoren Zhuang, Matthias Lipinski 2011-12-06
7947431 Lithography masks and methods of manufacture thereof Chandrasekhar Sarma, Alois Gutmann, Henning Haffner, Josef Maynollo 2011-05-24
7820458 Test structures and methods 2010-10-26
7807320 Overlay target for polarized light lithography 2010-10-05
7799486 Lithography masks and methods of manufacture thereof Chandrasekhar Sarma, Alois Gutmann, Henning Haffner, Josef Maynollo 2010-09-21
7713824 Small feature integrated circuit fabrication Chandrasekhar Sarma, Alois Gutmann, Josef Maynollo 2010-05-11
7687925 Alignment marks for polarized light lithography and method for use thereof Chandrasekhar Sarma, Alois Gutmann 2010-03-30
7674703 Gridded contacts in semiconductor devices Roberto Schiwon, Klaus Herold, Jenny Lian, Martin Ostermayr 2010-03-09
7666800 Feature patterning methods Alois Gutmann, Klaus Herold, Chandrasekhar Sarma 2010-02-23
7583362 Stray light feedback for dose control in semiconductor lithography systems Wai-Kin Li, Todd C. Bailey 2009-09-01
7556898 Overlay target for polarized light lithography 2009-07-07
7514356 Ribs for line collapse prevention in damascene structures O Seo Park, Wai-Kin Li, Todd C. Bailey 2009-04-07