TB

Todd C. Bailey

IBM: 15 patents #7,450 of 70,183Top 15%
University Of Texas System: 14 patents #114 of 6,559Top 2%
Infineon Technologies Ag: 4 patents #2,021 of 7,486Top 30%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
📍 Poughkeepsie, NY: #123 of 1,613 inventorsTop 8%
🗺 New York: #3,677 of 115,490 inventorsTop 4%
Overall (All Time): #113,277 of 4,157,543Top 3%
32
Patents All Time

Issued Patents All Time

Showing 26–32 of 32 patents

Patent #TitleCo-InventorsDate
6954275 Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography Byung-Jin Choi, Matthew E. Colburn, S. Sreenivasan, C. Grant Willson, John Ekerdt 2005-10-11
6921615 High-resolution overlay alignment methods for imprint lithography Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2005-07-26
6919152 High resolution overlay alignment systems for imprint lithography S. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2005-07-19
6916585 Method of varying template dimensions to achieve alignment during imprint lithography Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2005-07-12
6902853 Dual wavelength method of determining a relative position of a substrate and a template Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2005-06-07
6842229 Imprint lithography template comprising alignment marks Sidlgata V. Sreenivasan, Byung-Jin Choi, Matthew E. Colburn 2005-01-11
6696220 Template for room temperature, low pressure micro-and nano-imprint lithography Byung-Jin Choi, Matthew E. Colburn, S. Sreenivasan, C. Grant Willson, John Ekerdt 2004-02-24