MJ

Mohit Jain

IBM: 20 patents #5,451 of 70,183Top 8%
2C 24/7 Customer: 7 patents #5 of 48Top 15%
NC Nei & Company: 6 patents #2 of 19Top 15%
BL Bloomreach: 6 patents #3 of 61Top 5%
UT Uti: 5 patents #12 of 302Top 4%
PP Provectus Pharmatech: 5 patents #7 of 22Top 35%
Applied Materials: 4 patents #2,506 of 7,310Top 35%
SB Sapient Bioanalytics: 4 patents #2 of 4Top 50%
FI Fujifilm Business Innovation: 3 patents #2,355 of 5,238Top 45%
SS Stmicroelectronics Sa: 1 patents #938 of 1,676Top 60%
[2 [24]7.Ai: 1 patents #25 of 74Top 35%
JA Jasper Design Automation: 1 patents #22 of 35Top 65%
SK Showa Denko K.K.: 1 patents #940 of 1,736Top 55%
HO Honeywell: 1 patents #7,507 of 14,447Top 55%
AM AMD: 1 patents #5,683 of 9,279Top 65%
📍 Calgary, CA: #17 of 5,407 inventorsTop 1%
Overall (All Time): #34,159 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 51–64 of 64 patents

Patent #TitleCo-InventorsDate
7996251 System and method for customer requests and contact management Pallipuram V. Kannan, Reagan Miller 2011-08-09
7970889 Intelligent subscription builder Valerie M. Bennett, George L. Fridrich 2011-06-28
7711742 Intelligent data query builder Valerie M. Bennett, George L. Fridrich 2010-05-04
7506288 Interactive analysis and debugging of a circuit design during functional verification of the circuit design Chung-Wah Norris Ip 2009-03-17
7469371 Methods of testing a user design in a programmable integrated circuit Shekhar Bapat 2008-12-23
7246352 System for generating a virtual map to a plurality of files necessary for installing software from multiple networked locations Dennis Myers 2007-07-17
7182929 Nanostructured multi-component and doped oxide powders and method of making same Amit Singhal, Ganesh Skandan 2007-02-27
7130230 Systems for built-in-self-test for content addressable memories and methods of operating the same Danish Hasan Syed 2006-10-31
6911346 Method of etching a magnetic material Chentsau Ying, Xiaoyi Chen, Ajay Kumar 2005-06-28
6905800 Etching a substrate in a process zone Stephen Yuen, Thorsten Lill 2005-06-14
6829056 Monitoring dimensions of features at different locations in the processing of substrates Michael Barnes, John D. Holland, II, Hongqing Shan, Bryan Pu, Zhifeng Sui +5 more 2004-12-07
6617794 Method for controlling etch uniformity Michael Barnes, John Holland, Valentin Todorov, Alexander Paterson 2003-09-09
6613682 Method for in situ removal of a dielectric antireflective coating during a gate etch process Thorsten Lill, Jeff Chinn 2003-09-02
6599842 Method for rounding corners and removing damaged outer surfaces of a trench John Chao, Jeffrey D. Chinn 2003-07-29