Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
MM

Maharaj Mukherjee — 212 Patents

IBM: 119 patents #419 of 70,183Top 1%
Bank of America: 88 patents #12 of 5,361Top 1%
Globalfoundries: 3 patents #1,029 of 4,424Top 25%
DBDaedalus Blue: 2 patents #1 of 13Top 8%
Poughkeepsie, NY: #10 of 1,613 inventorsTop 1%
New York: #126 of 115,490 inventorsTop 1%
Overall (All Time): #2,922 of 4,157,543Top 1%
212 Patents All Time

Issued Patents All Time

Showing 176–200 of 212 patents

Patent #TitleCo-InventorsDate
8161422 Fast and accurate method to simulate intermediate range flare effects James A. Culp, Scott M. Mansfield, Kafai Lai, Alan E. Rosenbluth 2012-04-17
8150611 System and methods for providing predictive traffic information 2012-04-03
8138888 System and method for adjusting a seat using biometric information 2012-03-20
8078826 Effective memory clustering to minimize page fault and optimize memory utilization 2011-12-13
8073288 Rendering a mask using coarse mask representation Mark A. Lavin, Alan E. Rosenbluth 2011-12-06
8059884 Method and system for obtaining bounds on process parameters for OPC-verification Ioana Graur, Alan E. Rosenbluth 2011-11-15
7975244 Methodology and system for determining numerical errors in pixel-based imaging simulation in designing lithographic masks James A. Culp, Alan E. Rosenbluth 2011-07-05
7840057 Simultaneous computation of multiple points on one or multiple cut lines Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2010-11-23
7774737 Performance in model-based OPC engine utilizing efficient polygon pinning method Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2010-08-10
7761839 Performance in model-based OPC engine utilizing efficient polygon pinning method Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2010-07-20
7757233 Controlling a computer system having a processor including a plurality of cores 2010-07-13
7669175 Methodology to improve turnaround for integrated circuit design using geometrical hierarchy James A. Culp, Timothy G. Dunham, Mark A. Lavin 2010-02-23
7565633 Verifying mask layout printability using simulation with adjustable accuracy James A. Culp, Scott M. Mansfield 2009-07-21
7552417 System for search and analysis of systematic defects in integrated circuits Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Daniel N. Maynard 2009-06-23
7512927 Printability verification by progressive modeling accuracy Gregg M. Gallatin, Kafai Lai, Alan E. Rosenbluth 2009-03-31
7503028 Multilayer OPC for design aware manufacturing James A. Culp, Lars Liebmann, Scott M. Mansfield 2009-03-10
7434196 Renesting interaction map into design for efficient long range calculations Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2008-10-07
7415695 System for search and analysis of systematic defects in integrated circuits Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Daniel N. Maynard 2008-08-19
7404174 method for generating a set of test patterns for an optical proximity correction algorithm David L. DeMaris, Mark A. Lavin, William C. Leipold, Daniel N. Maynard 2008-07-22
7366342 Simultaneous computation of multiple points on one or multiple cut lines Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2008-04-29
7343582 Optical proximity correction using progressively smoothed mask shapes Scott M. Mansfield, Alan E. Rosenbluth, Kafai Lai 2008-03-11
7343271 Incorporation of a phase map into fast model-based optical proximity correction simulation kernels to account for near and mid-range flare Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2008-03-11
7328363 Dynamically configurable fault tolerance in autonomic computing with multiple service points 2008-02-05
7287239 Performance in model-based OPC engine utilizing efficient polygon pinning method Gregg M. Gallatin, Emanuel Gofman, Kafai Lai, Mark A. Lavin, Dov Ramm +2 more 2007-10-23
7284230 System for search and analysis of systematic defects in integrated circuits Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Daniel N. Maynard 2007-10-16