Emily Gallagher — 17 Patents at IBM

Emily Gallagher has been granted 17 US patents while listed as an inventor at IBM. The first was granted in 2007 and the most recent in March 2023. Emily Gallagher ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Emily Gallagher in Burlington, VT, US.

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11599019	Method for forming an extreme ultraviolet lithography pellicle	Marina Timmermans, Cedric Huyghebaert, Ivan Pollentier, Elie Schapmans	2023-03-07
11360380	Extreme ultraviolet lithography device	Joern-Holger Franke	2022-06-14
11181818	Lithography scanner	Joern-Holger Franke, Ivan Pollentier, Marina Timmermans, Marina Mariano Juste	2021-11-23
11163229	Induced stress for EUV pellicle tensioning	Marina Mariano Juste, Marina Timmermans, Ivan Pollentier, Cedric Huyghebaert	2021-11-02
11092886	Method for forming a pellicle	Marina Timmermans, Ivan Pollentier, Hanns Christoph Adelmann, Cedric Huyghebaert, Jae Uk Lee	2021-08-17
10720336	Method for manufacturing a mask	Roel Gronheid, Jan Doise, Iacopo Mochi	2020-07-21
10712659	Method for forming a carbon nanotube pellicle membrane	Cedric Huyghebaert, Ivan Pollentier, Hanns Christoph Adelmann, Marina Timmermans, Jae Uk Lee	2020-07-14
10353284	Lithographic reticle system	Rik Jonckheere, Cedric Huyghebaert	2019-07-16
9551924	Structure and method for fixing phase effects on EUV mask	Martin Burkhardt	2017-01-24	$6,164,000
9052617	Extreme ultraviolet (EUV) multilayer defect compensation and EUV masks	Gregory R. McIntyre, Alfred Wagner	2015-06-09	$3,292,000
8765331	Reducing edge die reflectivity in extreme ultraviolet lithography	Gregory R. McIntyre	2014-07-01	$3,868,000
8769445	Method for determining mask operation activities	Jed H. Rankin, Alan E. Rosenbluth	2014-07-01	$3,868,000
8748063	Extreme ultraviolet (EUV) multilayer defect compensation and EUV masks	Gregory R. McIntyre, Alfred Wagner	2014-06-10	$4,765,000
8586950	Method and system for feature function aware priority printing	Brian N. Caldwell, Steven C. Nash, Jed H. Rankin	2013-11-19	$3,686,000
8538129	Mask program defect test	Karen D. Badger, Christoper Magg	2013-09-17	$4,204,000
8227774	Method and system for feature function aware priority printing	Brian N. Caldwell, Steven C. Nash, Jed H. Rankin	2012-07-24	$4,383,000
7198872	Light scattering EUVL mask	Louis M. Kindt, Carey Thiel	2007-04-03	$7,379,000

Emily Gallagher — 17 Patents

Issued Patents All Time

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