Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8538129 | Mask program defect test | Emily Gallagher, Christoper Magg | 2013-09-17 |
| 8437967 | Method and system for inspecting multi-layer reticles | Karen S. Edwards, Patricia Mae Hynek, John-Mark Leonard, Maureen Fitzpatrick McFadden, David A. Merchant | 2013-05-07 |
| 7974802 | Photomask image inspection | Jim B. Densmore, Christopher R. Gillman, Kathleen G. Purdy, Cynthia Whiteside | 2011-07-05 |
| 7742632 | Alternating phase shift mask inspection using biased inspection data | Michael S. Hibbs, Christopher K. Magg | 2010-06-22 |
| 7619730 | Mask inspection DNIR replacement based on location of tri-tone level database images—2P shapes | David L. Katcoff, Jeffrey P. Lissor, Christopher K. Magg | 2009-11-17 |
| 7450748 | Mask inspection process accounting for mask writer proximity correction | James A. Culp, Azalia Krasnoperova | 2008-11-11 |
| 7443497 | Mask inspection DNIR placement based on location of tri-tone level database images (2P shapes) | David L. Katcoff, Jeffrey P. Lissor, Christopher K. Magg | 2008-10-28 |
| 6635390 | Method and system for reducing particulate contamination in a pellicle air space | James J. Colelli, Dean C. Humphrey | 2003-10-21 |