Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9996000 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Yuki Fujita, Raymond W. Jeffer, James P. Levin, Joseph L. Malenfant, Jr., Steven C. Nash | 2018-06-12 |
| 9989843 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Yuki Fujita, Raymond W. Jeffer, James P. Levin, Joseph L. Malenfant, Jr., Steven C. Nash | 2018-06-05 |
| 9372394 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Yuki Fujita, Raymond W. Jeffer, James P. Levin, Joseph L. Malenfant, Jr., Steven C. Nash | 2016-06-21 |
| 8586950 | Method and system for feature function aware priority printing | Emily Gallagher, Steven C. Nash, Jed H. Rankin | 2013-11-19 |
| 8227774 | Method and system for feature function aware priority printing | Emily Gallagher, Steven C. Nash, Jed H. Rankin | 2012-07-24 |
| 7496885 | Method of compensating for defective pattern generation data in a variable shaped electron beam system | Daniel Sullivan, Raymond W. Jeffer | 2009-02-24 |
| 7198276 | Adaptive electrostatic pin chuck | Raymond W. Jeffer, Louis M. Kindt | 2007-04-03 |