Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9996000 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Joseph L. Malenfant, Jr. | 2018-06-12 |
| 9989843 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Joseph L. Malenfant, Jr. | 2018-06-05 |
| 9372394 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Joseph L. Malenfant, Jr. | 2016-06-21 |
| 8586950 | Method and system for feature function aware priority printing | Brian N. Caldwell, Emily Gallagher, Jed H. Rankin | 2013-11-19 |
| 8227774 | Method and system for feature function aware priority printing | Brian N. Caldwell, Emily Gallagher, Jed H. Rankin | 2012-07-24 |
| 5459001 | Low stress electrodeposition of gold for x-ray mask fabrication | Scott A. Estes, Thomas B. Faure | 1995-10-17 |
| 5318687 | Low stress electrodeposition of gold for X-ray mask fabrication | Scott A. Estes, Thomas B. Faure | 1994-06-07 |