Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9996000 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Steven C. Nash | 2018-06-12 |
| 9989843 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Steven C. Nash | 2018-06-05 |
| 9372394 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, Raymond W. Jeffer, James P. Levin, Steven C. Nash | 2016-06-21 |
| 6426177 | Single component developer for use with ghost exposure | Thomas B. Faure, Steven Flanders, Lyndon S. Gibbs, James P. Levin, Harold G. Linde +1 more | 2002-07-30 |
| 6215125 | Method to operate GEF4 gas in hot cathode discharge ion sources | Jiong Chen, Brian S. Freer, John Francis Grant, Lawrence T. Jacobs | 2001-04-10 |