DN

Deborah A. Neumayer

IBM: 77 patents #896 of 70,183Top 2%
Samsung: 4 patents #25,854 of 75,807Top 35%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
WC W.R. Grace & Co.-Conn.: 2 patents #348 of 1,045Top 35%
University Of Texas System: 1 patents #2,951 of 6,559Top 45%
TL Tokyo Electron Limited: 1 patents #3,538 of 5,567Top 65%
📍 Danbury, CT: #8 of 826 inventorsTop 1%
🗺 Connecticut: #153 of 34,797 inventorsTop 1%
Overall (All Time): #20,145 of 4,157,543Top 1%
85
Patents All Time

Issued Patents All Time

Showing 26–50 of 85 patents

Patent #TitleCo-InventorsDate
9231063 Boron rich nitride cap for total ionizing dose mitigation in SOI devices Alfred Grill, Kenneth P. Rodbell 2016-01-05
9112068 Laser doping of crystalline semiconductors using a dopant-containing amorphous silicon stack for dopant source and passivation Katherine L. Saenger 2015-08-18
8895433 Method of forming a graphene cap for copper interconnect structures Griselda Bonilla, Christos D. Dimitrakopoulos, Alfred Grill, James B. Hannon, Qinghuang Lin +3 more 2014-11-25
8680511 Bilayer gate dielectric with low equivalent oxide thickness for graphene devices Christos D. Dimitrakopoulos, Damon B. Farmer, Alfred Grill, Yu-Ming Lin, Dirk Pfeiffer +1 more 2014-03-25
8623761 Method of forming a graphene cap for copper interconnect structures Griselda Bonilla, Christos D. Dimitrakopoulos, Alfred Grill, James B. Hannon, Qinghuang Lin +3 more 2014-01-07
8618663 Patternable dielectric film structure with improved lithography and method of fabricating same Qinghuang Lin 2013-12-31
8618183 Materials containing voids with void size controlled on the nanometer scale Stephen M. Gates, Alfred Grill, Son V. Nguyen, Vishnubhai V. Patel 2013-12-31
8604337 Method to evaluate effectiveness of substrate cleanness and quantity of pin holes in an antireflective coating of a solar cell John M. Cotte, Laura L. Kosbar, Xiaoyan Shao 2013-12-10
8530886 Nitride gate dielectric for graphene MOSFET Phaedon Avouris, Wenjuan Zhu 2013-09-10
8519260 Method to evaluate effectiveness of substrate cleanness and quantity of pin holes in an antireflective coating of a solar cell John M. Cotte, Laura L. Kosbar, Xiaoyan Shao 2013-08-27
8461039 Patternable low-K dielectric interconnect structure with a graded cap layer and method of fabrication Qinghuang Lin 2013-06-11
8455292 Deposition of germanium film Solomon Assefa, Pratik P. Joshi 2013-06-04
8373271 Interconnect structure with an oxygen-doped SiC antireflective coating and method of fabrication Dario L. Goldfarb, Ranee W. Kwong, Qinghuang Lin, Hosadurga Shobha 2013-02-12
8268411 Materials containing voids with void size controlled on the nanometer scale Stephen M. Gates, Alfred Grill, Son V. Nguyen, Vishnubhai V. Patel 2012-09-18
8202783 Patternable low-k dielectric interconnect structure with a graded cap layer and method of fabrication Qinghuang Lin 2012-06-19
8101150 Control of carbon nanotube diameter using CVD or PECVD growth Alfred Grill, Dinkar Singh 2012-01-24
8101236 Method of fabricating a SiCOH dielectric material with improved toughness and improved Si-C bonding Daniel C. Edelstein, Stephen M. Gates, Alfred Grill, Michael Lane, Qinghuang Lin +2 more 2012-01-24
8097932 Ultra low κ plasma enhanced chemical vapor deposition processes using a single bifunctional precursor containing both a SiCOH matrix functionality and organic porogen functionality Son V. Nguyen, Stephen M. Gates, Alfred Grill 2012-01-17
7915180 SiCOH film preparation using precursors with built-in porogen functionality Stephen M. Gates, Alfred Grill, Robert D. Miller, Son V. Nguyen 2011-03-29
7892648 SiCOH dielectric material with improved toughness and improved Si-C bonding Daniel C. Edelstein, Stephen M. Gates, Alfred Grill, Michael Lane, Robert D. Miller +1 more 2011-02-22
7790566 Semiconductor surface treatment for epitaxial growth Jack O. Chu 2010-09-07
7745863 Flip FERAM cell and method to form same James W. Adkisson, Charles T. Black, Alfred Grill, Randy W. Mann, Wilbur D. Pricer +2 more 2010-06-29
7674521 Materials containing voids with void size controlled on the nanometer scale Stephen M. Gates, Alfred Grill, Son V. Nguyen, Vishnubhai V. Patel 2010-03-09
7628974 Control of carbon nanotube diameter using CVD or PECVD growth Alfred Grill, Dinkar Singh 2009-12-08
7566938 Deposition of hafnium oxide and/or zirconium oxide and fabrication of passivated electronic structures Cyril Cabral, Jr., Alessandro C. Callegari, Michael A. Gribelyuk, Paul C. Jamison, Dianne L. Lacey +4 more 2009-07-28