Issued Patents All Time
Showing 26–50 of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10878291 | Visually guided query processing | Ashok Pon Kumar Sree Prakash, Ayushi Dalmia, Digbalay Bose, Sumanta Mukherjee, Raghavendra Singh +1 more | 2020-12-29 |
| 10810647 | Hybrid virtual and physical jewelry shopping experience | Mohit Jain, Pratyush Kumar, Megha Nawhal, Ashok Pon Kumar Sree Prakash, Anshul Bhavesh Shah +1 more | 2020-10-20 |
| 10805382 | Resource position planning for distributed demand satisfaction | Krishnasuri Narayanam, Sumanta Mukherjee, Francisco Barahona, Joao P. Goncalves | 2020-10-13 |
| 10657547 | Forecast model calibration | — | 2020-05-19 |
| 10574533 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Fook-Luen Heng, Steven N. Hirsch, Mark A. Lavin, Jun Qu +1 more | 2020-02-25 |
| 10516767 | Unifying realtime and static data for presenting over a web service | Steven N. Hirsch, Ashok Pon Kumar Sree Prakash, Ulrich A. Finkler, David O. S. Melville, Scott M. Mansfield | 2019-12-24 |
| 10387802 | Weather-driven multi-category infrastructure impact forecasting | Fook-Luen Heng, Zhiguo Li, Stuart A. Siegel, Haijing Wang | 2019-08-20 |
| 9893948 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Fook-Luen Heng, Steven N. Hirsch, Mark A. Lavin, Jun Qu +1 more | 2018-02-13 |
| 9882782 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Fook-Luen Heng, Steven N. Hirsch, Mark A. Lavin, Jun Qu +1 more | 2018-01-30 |
| 9841456 | Electric outage detection and localization | Chumki Basu, Kaushik Das, Ulrich A. Finkler, Jagabondhu Hazra, Ashok Pon Kumar +1 more | 2017-12-12 |
| 9536214 | Weather-driven multi-category infrastructure impact forecasting | Fook-Luen Heng, Zhiguo Li, Stuart A. Siegel, Haijing Wang | 2017-01-03 |
| 9323875 | Dynamically determining number of simulations required for characterizing intra-circuit incongruent variations | Peter A. Habitz, Amol A. Joshi, James E. Sundquist, Wangyang Zhang | 2016-04-26 |
| 9147031 | Analysis of chip-mean variation and independent intra-die variation for chip yield determination | Carl Radens | 2015-09-29 |
| 8969104 | Circuit technique to electrically characterize block mask shifts | Emrah Acar, Aditya Bansal, Dureseti Chidambarrao, Liang Pang | 2015-03-03 |
| 8682818 | Pareto sampling using simplicial refinement by derivative pursuit | — | 2014-03-25 |
| 8645293 | Pareto sampling using simplicial refinement by derivative pursuit | — | 2014-02-04 |
| 8606556 | Circuit-level validation of computer executable device/circuit simulators | Aditya Bansal, Pamela Castalino, Dallas Lea | 2013-12-10 |
| 8522173 | Spatial correlation-based estimation of yield of integrated circuits | Fook-Luen Heng, Alexey Y. Lvov | 2013-08-27 |
| 8510699 | Performance driven layout optimization using morphing of a basis set of representative layouts | Emrah Acar, Aditya Bansal, Rama N. Singh | 2013-08-13 |
| 8409882 | Differential FET structures for electrical monitoring of overlay | Emrah Acar, Aditya Bansal | 2013-04-02 |
| 8407632 | Detecting dose and focus variations during photolithography | Ibrahim M. Elfadel, Ying Liu, Stanislav Polonsky | 2013-03-26 |
| 8290761 | Method and apparatus for rapidly modeling and simulating intra-die statistical variations in integrated circuits using compressed parameter models | Sonia Singhal, Rob A. Rutenbar | 2012-10-16 |
| 8276102 | Spatial correlation-based estimation of yield of integrated circuits | Fook-Luen Heng, Alexey Y. Lvov | 2012-09-25 |
| 8155938 | Method and apparatus for sampling and predicting rare events in complex electronic devices, circuits and systems | Rob A. Rutenbar | 2012-04-10 |
| 7920992 | Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes | Rob A. Rutenbar, James Ma, Claire F. Fang | 2011-04-05 |