SH

Shoji Hotta

HI Hitachi: 6 patents #6,582 of 28,497Top 25%
HH Hitachi High-Technologies: 5 patents #533 of 1,917Top 30%
RT Renesas Technology: 4 patents #758 of 3,337Top 25%
📍 Tokyo, CA: #346 of 583 inventorsTop 60%
Overall (All Time): #321,385 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
10002743 Measurement system and measurement method Hiroki Kawada, Osamu Inoue 2018-06-19
9659744 Charged particle beam apparatus and inspection method using the same Natsuki Tsuno, Naomasa Suzuki, Hideyuki Kazumi, Yoshinobu Kimura 2017-05-23
8575547 Electron beam measurement apparatus Yasunari Sohda, Shinji Okazaki, Muneyuki Fukuda 2013-11-05
8148682 Method and apparatus for pattern position and overlay measurement Norio Hasegawa 2012-04-03
7943903 Defect inspection method and its system Shinji Okazaki, Yasunari Sohda, Yoshinori Nakayama 2011-05-17
7884325 Electron beam measurement apparatus Yasunari Sohda, Shinji Okazaki, Muneyuki Fukuda 2011-02-08
7419916 Manufacturing method of semiconductor device Junji Noguchi, Hideo Aoki, Takayuki Oshima 2008-09-02
7387867 Manufacturing method of semiconductor integrated circuit device Norio Hasegawa, Katsuya Hayano 2008-06-17
7109127 Manufacturing method of semiconductor device Junji Noguchi, Hideo Aoki, Takayuki Oshima 2006-09-19
6939649 Fabrication method of semiconductor integrated circuit device and mask Norio Hasegawa, Toshihiko Tanaka 2005-09-06
6774020 Semiconductor device and method of manufacturing the same Shinichi Fukada, Kazuo Nojiri, Takashi Yunogami, Hideo Aoki, Takayuki Oshima +1 more 2004-08-10
6656646 Fabrication method of semiconductor integrated circuit device Norio Hasegawa 2003-12-02
6555464 Semiconductor device and method of manufacturing the same Shinichi Fukada, Kazuo Nojiri, Takashi Yunogami, Hideo Aoki, Takayuki Oshima +1 more 2003-04-29
6528400 Method of manufacturing a semiconductor device Shinichi Fukada, Kazuo Nojiri, Takashi Yunogami, Hideo Aoki, Takayuki Oshima +1 more 2003-03-04
6340632 Method of manufacturing a semiconductor device Shinichi Fukada, Kazuo Nojiri, Takashi Yunogami, Hideo Aoki, Takayuki Oshima +1 more 2002-01-22