Issued Patents All Time
Showing 26–48 of 48 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9053902 | Charged-particle radiation apparatus | Yuta Ebine, Shinichi Tomita, Toshihiro Aoshima | 2015-06-09 |
| 9029766 | Scanning electron microscope | Hideo Morishita, Takashi Ohshima, Michio Hatano | 2015-05-12 |
| 9016833 | Printing apparatus | Kiyotaka Ogura, Hideyuki Kataoka | 2015-04-28 |
| 9012842 | Charged particle beam device and inclined observation image display method | Wataru Kotake, Shigeru Kawamata | 2015-04-21 |
| 8991970 | Printing device, discharge test device and discharge test method | — | 2015-03-31 |
| 8933400 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Tomohisa Ohtaki, Shinsuke Kawanishi | 2015-01-13 |
| 8921786 | Charged particle beam apparatus | Yusuke Ominami, Tomohisa Ohtaki | 2014-12-30 |
| 8866371 | Electric field discharge-type electron source | Souichi Katagiri, Takashi Ohshima | 2014-10-21 |
| 8809782 | Scanning electron microscope | Tomohisa Ohtaki, Masahiko Ajima, Mitsuru Onuma, Akira Omachi | 2014-08-19 |
| 8710439 | Charged particle beam apparatus | Yusuke Ominami, Tomohisa Ohtaki | 2014-04-29 |
| 8692195 | Charged particle radiation device | Junichi Katane | 2014-04-08 |
| 8629395 | Charged particle beam apparatus | Hideo Morishita, Michio Hatano, Takashi Ohshima, Mitsugu Sato, Tetsuya Sawahata +1 more | 2014-01-14 |
| 8608270 | Printing device, discharge test device and discharge test method | — | 2013-12-17 |
| 8388089 | Printing device, discharge test device and discharge test method | — | 2013-03-05 |
| 8294097 | Charged particle radiation device | Junichi Katane | 2012-10-23 |
| 8220906 | Liquid jet head, a liquid jet apparatus and a method for manufacturing a liquid jet head | — | 2012-07-17 |
| 8143573 | Charged particle beam apparatus | Junichi Katane, Shigeru Kawamata, Shinichi Tomita | 2012-03-27 |
| 8097848 | Scanning electron microscope | Michio Hatano, Nagahide Ishida, Shinichi Tomita, Wataru Kotake | 2012-01-17 |
| 8026491 | Charged particle beam apparatus and method for charged particle beam adjustment | Takeshi Ogashiwa, Mitsugu Sato, Atsushi Takane, Toshihide Agemura, Yuusuke Narita +3 more | 2011-09-27 |
| 7755045 | Scanning electron microscope | Michio Hatano, Shinichi Tomita, Junichi Katane | 2010-07-13 |
| 7557346 | Scanning electron microscope | Junichi Katane | 2009-07-07 |
| 7511271 | Scanning electron microscope | Michio Hatano, Shinichi Tomita, Junichi Katane | 2009-03-31 |
| 7154089 | Scanning electron microscope | Junichi Katane | 2006-12-26 |