Issued Patents All Time
Showing 26–50 of 200 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7688090 | Wafer-level burn-in and test | David V. Pedersen | 2010-03-30 |
| 7675311 | Wireless test system | Benjamin N. Eldridge, Charles A. Miller, A. Nicholas Sporck | 2010-03-09 |
| 7616016 | Probe card assembly and kit | Benjamin N. Eldridge, A. Nicholas Sporck | 2009-11-10 |
| 7613591 | Remote test facility with wireless interface to local facilities | Benjamin N. Eldridge | 2009-11-03 |
| 7601039 | Microelectronic contact structure and method of making same | Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2009-10-13 |
| 7579269 | Microelectronic spring contact elements | Benjamin N. Eldridge, Gaetan L. Mathieu, David V. Pedersen | 2009-08-25 |
| 7579856 | Probe structures with physically suspended electronic components | John K. Gritters | 2009-08-25 |
| 7557596 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten | 2009-07-07 |
| 7550842 | Integrated circuit assembly | Benjamin N. Eldridge, Charles A. Miller, A. Nicholas Sporck, Gary W. Grube, Gaetan L. Mathieu | 2009-06-23 |
| 7548055 | Testing an electronic device using test data from a plurality of testers | Benjamin N. Eldridge, Charles A. Miller, A. Nicholas Sporck | 2009-06-16 |
| 7534654 | Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component | David V. Pedersen, Benjamin N. Eldridge | 2009-05-19 |
| 7479792 | Methods for making plated through holes usable as interconnection wire or probe attachments | Gaetan L. Mathieu, Carl V. Reynolds | 2009-01-20 |
| 7463043 | Methods of probing an electronic device | Timothy E. Cooper, Benjamin N. Eldridge, Rod Martens, Gaetan L. Mathieu | 2008-12-09 |
| 7400157 | Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes | Gary W. Grube, Benjamin N. Eldridge, Gaetan L. Mathieu, Poya Lotfizadeh, Chih-Chiang Tseng | 2008-07-15 |
| 7352196 | Probe card assembly and kit | A. Nicholas Sporck, Benjamin N. Eldridge | 2008-04-01 |
| 7347702 | Contact carriers (tiles) for populating larger substrates with spring contacts | Benjamin N. Eldridge, Thomas H. Dozier, II, Gaetan L. Mathieu, William D. Smith | 2008-03-25 |
| 7345493 | Wafer-level burn-in and test | David V. Pedersen | 2008-03-18 |
| 7330039 | Method for making a socket to perform testing on integrated circuits | Gaetan L. Mathieu, Carl V. Reynolds | 2008-02-12 |
| 7291910 | Semiconductor chip assemblies, methods of making same and components for same | Thomas H. DiStefano | 2007-11-06 |
| 7271481 | Microelectronic component and assembly having leads with offset portions | Thomas H. DiStefano | 2007-09-18 |
| 7253651 | Remote test facility with wireless interface to local test facilities | Benjamin N. Eldridge | 2007-08-07 |
| 7225538 | Resilient contact structures formed and then attached to a substrate | Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu | 2007-06-05 |
| 7218094 | Wireless test system | Benjamin N. Eldridge, A. Nicholas Sporck, Charles A. Miller | 2007-05-15 |
| 7218127 | Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component | Timothy E. Cooper, Benjamin N. Eldridge, Rod Martens, Gaetan L. Mathieu | 2007-05-15 |
| 7202687 | Systems and methods for wireless semiconductor device testing | Benjamin N. Eldridge, Charles A. Miller, A. Nicholas Sporck | 2007-04-10 |