IK

Igor Y. Khandros

FO Formfactor: 140 patents #3 of 177Top 2%
TE Tessera: 36 patents #12 of 271Top 5%
IBM: 6 patents #16,453 of 70,183Top 25%
AB Abex: 4 patents #3 of 69Top 5%
BL Berkeley Lights: 4 patents #27 of 97Top 30%
University of California: 2 patents #4,561 of 18,278Top 25%
IS Ist: 2 patents #6 of 49Top 15%
NT Nutcracker Therapeutics: 1 patents #9 of 11Top 85%
📍 Orinda, CA: #3 of 531 inventorsTop 1%
🗺 California: #547 of 386,348 inventorsTop 1%
Overall (All Time): #3,369 of 4,157,543Top 1%
200
Patents All Time

Issued Patents All Time

Showing 76–100 of 200 patents

Patent #TitleCo-InventorsDate
6864105 Method of manufacturing a probe card Gary W. Grube, Benjamin N. Eldridge, Gaetan L. Mathieu, Poya Lotfizadeh, Chih-Chiang Tseng 2005-03-08
6840374 Apparatus and method for cleaning test probes Benjamin N. Eldridge, Treliant Fang, Gaetan L. Mathieu, Gary W. Grube, Michael A. Drush +1 more 2005-01-11
6838893 Probe card assembly A. Nicholas Sporck, Benjamin N. Eldridge 2005-01-04
6836962 Method and apparatus for shaping spring elements Thomas H. Dozier, II, Gary W. Grube, Gaetan L. Mathieu 2005-01-04
6835898 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2004-12-28
6825422 Interconnection element with contact blade Benjamin N. Eldridge, Gary W. Grube, Alec Madsen, Gaetan L. Mathieu 2004-11-30
6825052 Test assembly including a test die for testing a semiconductor product die Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten 2004-11-30
6818840 Method for manufacturing raised electrical contact pattern of controlled geometry 2004-11-16
6807734 Microelectronic contact structures, and methods of making same Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2004-10-26
6788094 Wafer-level burn-in and test David V. Pedersen 2004-09-07
6778406 Resilient contact structures for interconnecting electronic devices Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2004-08-17
6759311 Fan out of interconnect elements attached to semiconductor wafer Benjamin N. Eldridge 2004-07-06
6741085 Contact carriers (tiles) for populating larger substrates with spring contacts Benjamin N. Eldridge, Gaetan L. Mathieu, Thomas H. Dozier, II, William D. Smith 2004-05-25
6729019 Method of manufacturing a probe card Gary W. Grube, Benjamin N. Eldridge, Gaetan L. Mathieu 2004-05-04
6727579 ELECTRICAL CONTACT STRUCTURES FORMED BY CONFIGURING A FLEXIBLE WIRE TO HAVE A SPRINGABLE SHAPE AND OVERCOATING THE WIRE WITH AT LEAST ONE LAYER OF A RESILIENT CONDUCTIVE MATERIAL, METHODS OF MOUNTING THE CONTACT STRUCTURES TO ELECTRONIC COMPONENTS, AND APPLICATIONS FOR EMPLOYING THE CONTACT STRUCTURES Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2004-04-27
6727580 Microelectronic spring contact elements Benjamin N. Eldridge, Gaetan L. Mathieu, David V. Pedersen 2004-04-27
6701612 Method and apparatus for shaping spring elements Thomas H. Dozier, II, Gary W. Grube, Gaetan L. Mathieu 2004-03-09
6690185 Large contactor with multiple, aligned contactor units David V. Pedersen, Ralph G. Whitten 2004-02-10
6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2003-12-30
6664628 Electronic component overlapping dice of unsingulated semiconductor wafer David V. Pedersen, Benjamin N. Eldridge, Richard S. Roy, Gaetan L. Mathieu 2003-12-16
6655023 Method and apparatus for burning-in semiconductor devices in wafer form Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2003-12-02
6642625 Sockets for “springed” semiconductor devices Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu, David V. Pederson +1 more 2003-11-04
6624648 Probe card assembly Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2003-09-23
6621260 Special contact points for accessing internal circuitry of an integrated circuit Benjamin N. Eldridge, David V. Pedersen, Ralph G. Whitten 2003-09-16
6615485 Probe card assembly and kit, and methods of making same Benjamin N. Eldridge, Gary W. Grube, Gaetan L. Mathieu 2003-09-09