Lambert Danner — 16 Patents at Danaher

Lambert Danner has been granted 16 US patents while listed as an inventor at Danaher. The first was granted in 1983 and the most recent in July 2015. Lambert Danner ranks #284,196 of 4,157,543 US inventors in our database (top 6.8%). Patent records list Lambert Danner in Wien, AT.

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #	Title	Co-Inventors	Date
9091525	Method for focusing an object plane and optical assembly	Wolfgang Sulik, Alexander Buettner	2015-07-28
8451440	Apparatus for the optical inspection of wafers	Kurt Hahn, Roland Hedrich, Gerhard Hoppen, Albert Kreh, Wolfgang Vollrath +4 more	2013-05-28
8154718	Apparatus and method for inspecting micro-structured devices on a semiconductor substrate	Uwe Graf	2012-04-10
7561263	Apparatus for illuminating and inspecting a surface	Michael Heiden, Alexander Buettner	2009-07-14
7420670	Measuring instrument and method for operating a measuring instrument for optical inspection of an object	Klaus Rinn	2008-09-02
7271889	Device and method for inspecting an object	Franz Cemic, Uwe Graf, Robert Mainberger, Dirk Sönksen, Volker Knorz	2007-09-18
7268940	Illuminating device	Michael Veith	2007-09-11
7209243	Illumination device, and coordinate measuring instrument having an illumination device	Franz Cemic, Gerhard Hoppen	2007-04-24
6975409	Illumination device; and coordinate measuring instrument having an illumination device	Franz Cemic, Gerhard Hoppen	2005-12-13
6943901	Critical dimension measuring instrument	Franz Cemic	2005-09-13
6879440	Autofocus module and method for a microscope-based system	Franz Cemic, Robert Mainberger, Michael Veith, Martin Osterfeld, Uwe Graf	2005-04-12
6624930	Illumination device for a DUV microscope and DUV microscope	Frank Eisenkrämer, Michael Veith, Wolfgang Vollrath, Martin Osterfeld	2003-09-23
6618154	Optical measurement arrangement, in particular for layer thickness measurement	Horst Engel, Hakon Mikkelsen, Matthias Slodowski, Kuno Backhaus, Joachim Wienecke	2003-09-09
6600560	Optical measurement arrangement having an ellipsometer	Hakon Mikkelsen, Horst Engel, Christof Stey	2003-07-29
4417787	Five-component microscope objective	—	1983-11-29
4384765	Six-component microscope objective	—	1983-05-24

Lambert Danner — 16 Patents

Issued Patents All Time

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