Issued Patents All Time
Showing 25 most recent of 161 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387029 | Computing parasitic values for semiconductor designs | Nagesh Shirali, Donald Oriordan | 2025-08-12 |
| 12372864 | Methods and systems to determine shapes for semiconductor or flat panel display fabrication | Nagesh Shirali, Donald Oriordan | 2025-07-29 |
| 12340164 | Methods and systems for reticle enhancement technology of a design pattern to be manufactured on a substrate | P. Jeffrey Ungar, Nagesh Shirali | 2025-06-24 |
| 12287567 | Method and system for reticle enhancement technology | Nagesh Shirali, Ajay Baranwal | 2025-04-29 |
| 12248242 | Methods and systems for reticle enhancement technology of a design pattern to be manufactured on a substrate | P. Jeffrey Ungar, Nagesh Shirali | 2025-03-11 |
| 12243712 | Method and system for determining a charged particle beam exposure for a local pattern density | Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie, Ryan Pearman | 2025-03-04 |
| 12019973 | Method for reticle enhancement technology of a design pattern to be manufactured on a substrate | P. Jeffrey Ungar, Nagesh Shirali | 2024-06-25 |
| 11953824 | Method for reticle enhancement technology of a design pattern to be manufactured on a substrate | P. Jeffrey Ungar, Nagesh Shirali | 2024-04-09 |
| 11921420 | Method and system for reticle enhancement technology | Nagesh Shirali, Ajay Baranwal | 2024-03-05 |
| 11886166 | Method and system of reducing charged particle beam write time | Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie, Ryan Pearman | 2024-01-30 |
| 11783110 | Method for reticle enhancement technology of a design pattern to be manufactured on a substrate | P. Jeffrey Ungar, Nagesh Shirali | 2023-10-10 |
| 11756765 | Method and system for determining a charged particle beam exposure for a local pattern density | Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie, Ryan Pearman | 2023-09-12 |
| 11693306 | Method for reticle enhancement technology of a design pattern to be manufactured on a substrate | P. Jeffrey Ungar, Nagesh Shirali | 2023-07-04 |
| 11604451 | Method and system of reducing charged particle beam write time | Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie, Ryan Pearman | 2023-03-14 |
| 11592802 | Method and system of reducing charged particle beam write time | Harold Robert Zable, Nagesh Shirali, William E. Guthrie, Ryan Pearman | 2023-02-28 |
| 11264206 | Methods and systems for forming a pattern on a surface using multi-beam charged particle beam lithography | Thang Nguyen, Ajay Baranwal, Michael Meyer, Suhas Pillai | 2022-03-01 |
| 11062878 | Method and system for determining a charged particle beam exposure for a local pattern density | Harold Robert Zable, Nagesh Shirali, William E. Guthrie, Ryan Pearman | 2021-07-13 |
| 10884395 | Method and system of reducing charged particle beam write time | Harold Robert Zable, Nagesh Shirali, William E. Guthrie, Ryan Pearman | 2021-01-05 |
| 10748744 | Method and system for determining a charged particle beam exposure for a local pattern density | Harold Robert Zable, Nagesh Shirali, William E. Guthrie, Ryan Pearman | 2020-08-18 |
| 10460071 | Shaped beam lithography including temperature effects | Harold Robert Zable, Ryan Pearman, William E. Guthrie | 2019-10-29 |
| 10431422 | Method and system for dimensional uniformity using charged particle beam lithography | Kazuyuki Hagiwara, Robert C. Pack | 2019-10-01 |
| 10317790 | Sub-resolution assist features in semiconductor pattern writing | Leo Hok Lai Pang | 2019-06-11 |
| 10290467 | Method and system for forming a pattern on a surface using multi-beam charged particle beam lithography | — | 2019-05-14 |
| 10101648 | Method and system for forming a pattern on a reticle using charged particle beam lithography | — | 2018-10-16 |
| 10031413 | Method and system for forming patterns using charged particle beam lithography | Anatoly Aadamov, Eldar Khaliullin, Ingo Bork | 2018-07-24 |