Ryan Pearman — 12 Patents at D2S

Ryan Pearman has been granted 12 US patents while listed as an inventor at D2S. The first was granted in 2015 and the most recent in March 2025. Ryan Pearman ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Ryan Pearman in San Jose, CA, US.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12243712	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie	2025-03-04
11886166	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie	2024-01-30
11756765	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie	2023-09-12
11604451	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, William E. Guthrie	2023-03-14
11592802	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, William E. Guthrie	2023-02-28
11062878	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, William E. Guthrie	2021-07-13
10884395	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, William E. Guthrie	2021-01-05
10748744	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, William E. Guthrie	2020-08-18
10460071	Shaped beam lithography including temperature effects	Akira Fujimura, Harold Robert Zable, William E. Guthrie	2019-10-29
9104109	Method and system for improving critical dimension uniformity using shaped beam lithography	Akira Fujimura, Anatoly Aadamov	2015-08-11
9046761	Lithography mask having sub-resolution phased assist features	Shem Ogadhoh, Charles H. Wallace, Sven Henrichs, Arvind Sundaramurthy, Swaminathan Sivakumar	2015-06-02	$17,367,000
9038003	Method and system for critical dimension uniformity using charged particle beam lithography	Robert C. Pack, Akira Fujimura	2015-05-19

Ryan Pearman — 12 Patents

Issued Patents All Time

Patent Widget