Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12243712 | Method and system for determining a charged particle beam exposure for a local pattern density | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman | 2025-03-04 |
| 11886166 | Method and system of reducing charged particle beam write time | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman | 2024-01-30 |
| 11756765 | Method and system for determining a charged particle beam exposure for a local pattern density | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman | 2023-09-12 |
| 11604451 | Method and system of reducing charged particle beam write time | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman | 2023-03-14 |
| 11592802 | Method and system of reducing charged particle beam write time | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman | 2023-02-28 |
| 11062878 | Method and system for determining a charged particle beam exposure for a local pattern density | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman | 2021-07-13 |
| 10884395 | Method and system of reducing charged particle beam write time | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman | 2021-01-05 |
| 10748744 | Method and system for determining a charged particle beam exposure for a local pattern density | Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman | 2020-08-18 |
| 10564853 | System and method for locality detection to identify read or write streams in a memory device | Vitali Linkovsky, Shay Benisty, Scheheresade Virani | 2020-02-18 |
| 10460071 | Shaped beam lithography including temperature effects | Akira Fujimura, Harold Robert Zable, Ryan Pearman | 2019-10-29 |
| 6823294 | Method and system for measuring circuit design capability | — | 2004-11-23 |