William E. Guthrie — 11 Patents at D2S

William E. Guthrie has been granted 11 US patents while listed as an inventor at D2S. The first was granted in 2004 and the most recent in March 2025. William E. Guthrie ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list William E. Guthrie in Santa Clara, CA, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12243712	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman	2025-03-04
11886166	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman	2024-01-30
11756765	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman	2023-09-12
11604451	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Abhishek Shendre, Ryan Pearman	2023-03-14
11592802	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman	2023-02-28
11062878	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman	2021-07-13
10884395	Method and system of reducing charged particle beam write time	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman	2021-01-05
10748744	Method and system for determining a charged particle beam exposure for a local pattern density	Akira Fujimura, Harold Robert Zable, Nagesh Shirali, Ryan Pearman	2020-08-18
10564853	System and method for locality detection to identify read or write streams in a memory device	Vitali Linkovsky, Shay Benisty, Scheheresade Virani	2020-02-18	$8,681,000
10460071	Shaped beam lithography including temperature effects	Akira Fujimura, Harold Robert Zable, Ryan Pearman	2019-10-29
6823294	Method and system for measuring circuit design capability	—	2004-11-23

William E. Guthrie — 11 Patents

Issued Patents All Time

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