Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340495 | Method for computational metrology and inspection for patterns to be manufactured on a substrate | Linyong Pang, Jocelyn Blair | 2025-06-24 |
| 12288022 | Methods and systems for generating shape data for electronic designs | Suhas Pillai, Thang Nguyen | 2025-04-29 |
| 12287567 | Method and system for reticle enhancement technology | Akira Fujimura, Nagesh Shirali | 2025-04-29 |
| 12045996 | Methods and systems for registering images for electronic designs | Suhas Pillai, Thang Nguyen | 2024-07-23 |
| 11921420 | Method and system for reticle enhancement technology | Akira Fujimura, Nagesh Shirali | 2024-03-05 |
| 11847400 | Methods and systems for generating shape data for electronic designs | Suhas Pillai, Thang Nguyen | 2023-12-19 |
| 11823423 | Methods and systems for compressing shape data for electronic designs | Thang Nguyen, Michael Meyer | 2023-11-21 |
| 11264206 | Methods and systems for forming a pattern on a surface using multi-beam charged particle beam lithography | Akira Fujimura, Thang Nguyen, Michael Meyer, Suhas Pillai | 2022-03-01 |
| 11250199 | Methods and systems for generating shape data for electronic designs | Suhas Pillai, Thang Nguyen | 2022-02-15 |
| 11182929 | Methods and systems for compressing shape data for electronic designs | Thang Nguyen, Michael Meyer | 2021-11-23 |
| 10592634 | Systems and methods for automatic handling of engineering design parameter violations | Norman Chang | 2020-03-17 |