Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340495 | Method for computational metrology and inspection for patterns to be manufactured on a substrate | Linyong Pang, Ajay Baranwal | 2025-06-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340495 | Method for computational metrology and inspection for patterns to be manufactured on a substrate | Linyong Pang, Ajay Baranwal | 2025-06-24 |