Issued Patents All Time
Showing 25 most recent of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340495 | Method for computational metrology and inspection for patterns to be manufactured on a substrate | Jocelyn Blair, Ajay Baranwal | 2025-06-24 |
| 9494854 | Technique for repairing an EUV photo-mask | Masaki Satake | 2016-11-15 |
| 9091935 | Multistage extreme ultra-violet mask qualification | — | 2015-07-28 |
| 8683396 | Determining source patterns for use in photolithography | Changquing Hu | 2014-03-25 |
| 8653454 | Electron-beam image reconstruction | Dongxue Chen, Changqing Hu | 2014-02-18 |
| 8612903 | Technique for repairing a reflective photo-mask | Christopher Heinz Clifford | 2013-12-17 |
| 8498469 | Full-field mask error enhancement function | Guangming Xiao, Thomas Christopher Cecil, Robert E. Gleason, John F. McCarty | 2013-07-30 |
| 8463016 | Extending the field of view of a mask-inspection image | — | 2013-06-11 |
| 8458622 | Photo-mask acceptance technique | Danping Peng, Vikram Tolani | 2013-06-04 |
| 8386968 | Virtual photo-mask critical-dimension measurement | — | 2013-02-26 |
| 8111898 | Method for facilitating automatic analysis of defect printability | — | 2012-02-07 |
| 8082525 | Technique for correcting hotspots in mask patterns and write patterns | Yong Liu, John F. McCarty, Kelly Gordon Russell | 2011-12-20 |
| 7837624 | Medical diagnostic ultrasound imaging methods for extended field of view | John A. Hossack | 2010-11-23 |
| 7835565 | System and method of providing mask defect printability analysis | Lynn Cai, Linard Karklin | 2010-11-16 |
| 7756304 | Medical diagnostic ultrasonic imaging method and system for displaying multi-phase, multi-frame images | John A. Hossack, Thilaka Sumanaweera | 2010-07-13 |
| 7689967 | Reference image generation from subject image for photolithography mask analysis | — | 2010-03-30 |
| 7617474 | System and method for providing defect printability analysis of photolithographic masks with job-based automation | Fang-Cheng Chang | 2009-11-10 |
| 7565001 | System and method of providing mask defect printability analysis | Lynn Cai, Linard Karklin | 2009-07-21 |
| 7403649 | System and method of providing mask defect printability analysis | Lynn Cai, Linard Karklin | 2008-07-22 |
| 7254251 | System and method of providing mask defect printability analysis | Lynn Cai, Linard Karklin | 2007-08-07 |
| 7152219 | Reference image generation from subject image for photolithography mask analysis | — | 2006-12-19 |
| 7093226 | Method and apparatus of wafer print simulation using hybrid model with mask optical images | — | 2006-08-15 |
| 7093229 | System and method for providing defect printability analysis of photolithographic masks with job-based automation | Fang-Cheng Chang | 2006-08-15 |
| 7043071 | Soft defect printability simulation and analysis for masks | Qi-De Qian | 2006-05-09 |
| 7003755 | User interface for a networked-based mask defect printability analysis system | Daniel Howard | 2006-02-21 |