Linyong Pang — 39 Patents at Synopsys

Linyong Pang has been granted 39 US patents while listed as an inventor at Synopsys. The first was granted in 2000 and the most recent in June 2025. Linyong Pang ranks #81,245 of 4,157,543 US inventors in our database (top 2.0%). Patent records list Linyong Pang in Monte Sereno, CA, US.

Issued Patents All Time

Showing 1–25 of 39 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12340495	Method for computational metrology and inspection for patterns to be manufactured on a substrate	Jocelyn Blair, Ajay Baranwal	2025-06-24
9494854	Technique for repairing an EUV photo-mask	Masaki Satake	2016-11-15
9091935	Multistage extreme ultra-violet mask qualification	—	2015-07-28	$6,511,000
8683396	Determining source patterns for use in photolithography	Changquing Hu	2014-03-25	$4,284,000
8653454	Electron-beam image reconstruction	Dongxue Chen, Changqing Hu	2014-02-18
8612903	Technique for repairing a reflective photo-mask	Christopher Heinz Clifford	2013-12-17
8498469	Full-field mask error enhancement function	Guangming Xiao, Thomas Christopher Cecil, Robert E. Gleason, John F. McCarty	2013-07-30	$22,073,000
8463016	Extending the field of view of a mask-inspection image	—	2013-06-11
8458622	Photo-mask acceptance technique	Danping Peng, Vikram Tolani	2013-06-04
8386968	Virtual photo-mask critical-dimension measurement	—	2013-02-26
8111898	Method for facilitating automatic analysis of defect printability	—	2012-02-07	$4,212,000
8082525	Technique for correcting hotspots in mask patterns and write patterns	Yong Liu, John F. McCarty, Kelly Gordon Russell	2011-12-20
7837624	Medical diagnostic ultrasound imaging methods for extended field of view	John A. Hossack	2010-11-23	$802,000
7835565	System and method of providing mask defect printability analysis	Lynn Cai, Linard Karklin	2010-11-16	$2,454,000
7756304	Medical diagnostic ultrasonic imaging method and system for displaying multi-phase, multi-frame images	John A. Hossack, Thilaka Sumanaweera	2010-07-13	$1,128,000
7689967	Reference image generation from subject image for photolithography mask analysis	—	2010-03-30	$8,129,000
7617474	System and method for providing defect printability analysis of photolithographic masks with job-based automation	Fang-Cheng Chang	2009-11-10	$4,782,000
7565001	System and method of providing mask defect printability analysis	Lynn Cai, Linard Karklin	2009-07-21	$23,797,000
7403649	System and method of providing mask defect printability analysis	Lynn Cai, Linard Karklin	2008-07-22	$11,461,000
7254251	System and method of providing mask defect printability analysis	Lynn Cai, Linard Karklin	2007-08-07	$4,494,000
7152219	Reference image generation from subject image for photolithography mask analysis	—	2006-12-19	$19,191,000
7093226	Method and apparatus of wafer print simulation using hybrid model with mask optical images	—	2006-08-15	$3,745,000
7093229	System and method for providing defect printability analysis of photolithographic masks with job-based automation	Fang-Cheng Chang	2006-08-15	$3,745,000
7043071	Soft defect printability simulation and analysis for masks	Qi-De Qian	2006-05-09	$7,406,000
7003755	User interface for a networked-based mask defect printability analysis system	Daniel Howard	2006-02-21	$5,348,000

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Linyong Pang — 39 Patents

Issued Patents All Time

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