Patents per Year
Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7835565 | System and method of providing mask defect printability analysis | Linard Karklin, Linyong Pang | 2010-11-16 | $2,454,000 |
| 7565001 | System and method of providing mask defect printability analysis | Linard Karklin, Linyong Pang | 2009-07-21 | $23,797,000 |
| 7403649 | System and method of providing mask defect printability analysis | Linard Karklin, Linyong Pang | 2008-07-22 | $11,461,000 |
| 7254251 | System and method of providing mask defect printability analysis | Linard Karklin, Linyong Pang | 2007-08-07 | $4,494,000 |
| 6925202 | System and method of providing mask quality control | Linard Karklin, Linyong Pang | 2005-08-02 | $25,689,000 |
| 6873720 | System and method of providing mask defect printability analysis | Linard Karklin, Linyong Pang | 2005-03-29 | $13,529,000 |
| 6870951 | Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysis | — | 2005-03-22 |