Linard Karklin — 11 Patents at Synopsys

Linard Karklin has been granted 11 US patents while listed as an inventor at Synopsys. The first was granted in 2003 and the most recent in November 2010. Linard Karklin ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Linard Karklin in Sunnyvale, CA, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7835565	System and method of providing mask defect printability analysis	Lynn Cai, Linyong Pang	2010-11-16	$2,454,000
7565001	System and method of providing mask defect printability analysis	Lynn Cai, Linyong Pang	2009-07-21	$23,797,000
7523027	Visual inspection and verification system	Fang-Cheng Chang, Yao-Ting Wang, Yagyensh C. Pati	2009-04-21	$4,880,000
7403649	System and method of providing mask defect printability analysis	Lynn Cai, Linyong Pang	2008-07-22	$11,461,000
7254251	System and method of providing mask defect printability analysis	Lynn Cai, Linyong Pang	2007-08-07	$4,494,000
7107571	Visual analysis and verification system using advanced tools	Fang-Cheng Chang, Yao-Ting Wang, Yagyensh C. Pati	2006-09-12	$6,134,000
6925202	System and method of providing mask quality control	Linyong Pang, Lynn Cai	2005-08-02	$25,689,000
6873720	System and method of providing mask defect printability analysis	Lynn Cai, Linyong Pang	2005-03-29	$13,529,000
6757645	Visual inspection and verification system	Fang-Cheng Chang, Yao-Ting Wang, Yagyensh C. Pati	2004-06-29
6681376	Integrated scheme for semiconductor device verification	Artur P. Balasinski, Valery Axelrad	2004-01-20	$8,504,000
6578188	Method and apparatus for a network-based mask defect printability analysis system	Linyong Pang, Daniel Howard	2003-06-10

Linard Karklin — 11 Patents

Issued Patents All Time

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