Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7835565 | System and method of providing mask defect printability analysis | Lynn Cai, Linyong Pang | 2010-11-16 |
| 7565001 | System and method of providing mask defect printability analysis | Lynn Cai, Linyong Pang | 2009-07-21 |
| 7523027 | Visual inspection and verification system | Fang-Cheng Chang, Yao-Ting Wang, Yagyensh C. Pati | 2009-04-21 |
| 7403649 | System and method of providing mask defect printability analysis | Lynn Cai, Linyong Pang | 2008-07-22 |
| 7254251 | System and method of providing mask defect printability analysis | Lynn Cai, Linyong Pang | 2007-08-07 |
| 7107571 | Visual analysis and verification system using advanced tools | Fang-Cheng Chang, Yao-Ting Wang, Yagyensh C. Pati | 2006-09-12 |
| 6925202 | System and method of providing mask quality control | Linyong Pang, Lynn Cai | 2005-08-02 |
| 6873720 | System and method of providing mask defect printability analysis | Lynn Cai, Linyong Pang | 2005-03-29 |
| 6757645 | Visual inspection and verification system | Fang-Cheng Chang, Yao-Ting Wang, Yagyensh C. Pati | 2004-06-29 |
| 6681376 | Integrated scheme for semiconductor device verification | Artur P. Balasinski, Valery Axelrad | 2004-01-20 |
| 6578188 | Method and apparatus for a network-based mask defect printability analysis system | Linyong Pang, Daniel Howard | 2003-06-10 |