KM

Kevin Moeggenborg

CM Cabot Microelectronics: 18 patents #6 of 207Top 3%
NC Nalco Chemical: 13 patents #25 of 631Top 4%
Dow Corning: 1 patents #971 of 1,768Top 55%
DS Dow Silicones: 1 patents #322 of 722Top 45%
Overall (All Time): #108,152 of 4,157,543Top 3%
33
Patents All Time

Issued Patents All Time

Showing 25 most recent of 33 patents

Patent #TitleCo-InventorsDate
10002760 Method for manufacturing SiC wafer fit for integration with power device manufacturing technology Darren Hansen, Mark Loboda, Ian Manning, Stephan Mueller, Christopher Parfeniuk +3 more 2018-06-19
9303187 Compositions and methods for CMP of silicon oxide, silicon nitride, and polysilicon materials Dimitry Dinega, William Ward, Daniel Mateja 2016-04-05
9279192 Method for manufacturing SiC wafer fit for integration with power device manufacturing technology Darren Hansen, Mark Loboda, Ian Manning, Stephan Mueller, Christopher Parfeniuk +3 more 2016-03-08
8691695 CMP compositions and methods for suppressing polysilicon removal rates William Ward, Ming-Shih Tsai, Francesco De Rege Thesauro 2014-04-08
8597538 Composition for improving dryness during wire sawing Nevin Naguib Sant, Steven Grumbine 2013-12-03
8251777 Polishing slurry for aluminum and aluminum alloys John Clark, Jeffrey Gilliland, Stanley Lesiak, Susan Wilson, Vlasta Brusic 2012-08-28
8101093 Chemical-mechanical polishing composition and method for using the same Francesco De Rege Thesauro, Vlasta Brusic, Benjamin Bayer 2012-01-24
7998866 Silicon carbide polishing method utilizing water-soluble oxidizers Michael White, Lamon Jones, Jeffrey Gilliland 2011-08-16
7754098 Chemical-mechanical polishing composition and method for using the same David Schroeder 2010-07-13
7678700 Silicon carbide polishing method utilizing water-soluble oxidizers Mukesh Desai, Phillip W. Carter 2010-03-16
7485241 Chemical-mechanical polishing composition and method for using the same David Schroeder 2009-02-03
7306637 Anionic abrasive particles treated with positively charged polyelectrolytes for CMP Isaac K. Cherian, Phillip W. Carter, Jeffrey P. Chamberlain, David W. Boldridge 2007-12-11
7255810 Polishing system comprising a highly branched polymer Fred Sun 2007-08-14
7004819 CMP systems and methods utilizing amine-containing polymers Isaac K. Cherian, Vlasta Brusic 2006-02-28
6974777 CMP compositions for low-k dielectric materials Homer Chou, Joseph Hawkins, Jeffrey P. Chamberlain 2005-12-13
6936543 CMP method utilizing amphiphilic nonionic surfactants David Schroeder, Homer Chou, Jeffrey P. Chamberlain, Joseph Hawkins, Phillip W. Carter 2005-08-30
6841479 Method of reducing in-trench smearing during polishing Isaac K. Cherian, Paul M. Feeney 2005-01-11
6776810 Anionic abrasive particles treated with positively charged polyelectrolytes for CMP Isaac K. Cherian, Phillip W. Carter, Jeffrey P. Chamberlain, David W. Boldridge 2004-08-17
6589100 Rare earth salt/oxidizer-based CMP method Vlasta Brusic Kaufman, Isaac K. Cherian 2003-07-08
6527622 CMP method for noble metals Vlasta Brusic, Francesco M. De Rege, Isaac K. Cherian, Renjie Zhou 2003-03-04
6153106 Method for inhibiting the formation and deposition of silica scale in water systems Douglas G. Kelley, David P. Workman 2000-11-28
6075082 Cross-linked polymide binders for ceramics manufacture David P. Workman, Kristy M. Bailey 2000-06-13
6060318 Tracing of process additives in industrial ceramics applications James E. Whitten, Joseph C. Alfano 2000-05-09
6005040 Preparation and utility of water-soluble polymers having pendant derivatized amide, ester or ether functionalities as ceramics dispersants and binders Christopher P. Howland, John D. Morris, Peter E. Reed, Jiansheng Tang, Jin-Shan Wang 1999-12-21
5922801 Polyamide binders for ceramics manufacture Kristy M. Bailey, Christopher P. Howland 1999-07-13