AK

Andreas Klipp

Basf Se: 25 patents #477 of 13,826Top 4%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
QA Qimonda Ag: 1 patents #252 of 575Top 45%
Overall (All Time): #135,147 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 25 most recent of 28 patents

Patent #TitleCo-InventorsDate
12331239 Composition and process for selectively etching a layer comprising an aluminium compound in the presence of layers of low-k materials, copper and/or cobalt Joannes Theodorus Valentinus Hoogboom, Jhih Jheng Ke, Che Wei Wang, Yi-Ping Cheng 2025-06-17
12084628 Composition comprising a primary and a secondary surfactant, for cleaning or rinsing a product I Chen Chou, Berthold Ferstl 2024-09-10
12024693 Imidazolidinethione-containing compositions for post-ash residue removal and/or for oxidative etching of a layer or mask comprising TiN Joannes Theodorus Valentinus Hoogboom, Jhih Jheng Ke, Yi-Ping Cheng 2024-07-02
11742197 Cleavable additives for use in a method of making a semiconductor substrate Christian Bittner, Simon Braun, Guenter Oetter, Yeni Burk 2023-08-29
11377624 Cleaning composition for post-etch or post ash residue removal from a semiconductor substrate and corresponding manufacturing process Jhih Jheng Ke, Yi-Ping Cheng, Joannes Theodorus Valentinus Hoogboom 2022-07-05
11180719 Use of compositions comprising a siloxane-type additive for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below Daniel LOEFFLER, Mei Chin SHEN, Sheng-Hsuan Wei, Frank Oliver Heinrich Pirrung, Lothar Alexander Engelbrecht +3 more 2021-11-23
11168239 Chemical-mechanical polishing composition comprising benzotriazole derivatives as corrosion inhibitors Robert REICHARDT, Martin Kaller, Michael Lauter, Yuzhuo Li 2021-11-09
10865361 Composition for post chemical-mechanical-polishing cleaning Christian Daeschlein, Max Siebert, Michael Lauter, Leonardus Leunissen, Ivan Garcia Romero +3 more 2020-12-15
10844325 Composition for post chemical-mechanical-polishing cleaning Christian Daeschlein, Max Siebert, Michael Lauter, Peter Przybylski, Julian Proelss +4 more 2020-11-24
10844333 Composition for post chemical-mechanical-polishing cleaning Christian Daeschlein, Max Siebert, Michael Lauter, Piotr Przybylski, Julian Proelss +4 more 2020-11-24
10647900 Chemical-mechanical polishing composition comprising benzotriazole derivatives as corrosion inhibitors Robert REICHARDT, Martin Kaller, Michael Lauter, Yuzhuo Li 2020-05-12
10538724 Defect reduction rinse solution containing ammonium salts of sulfoesters Christian Bittner, Guenter Oetter, Andrei Honciuc, Simon Braun 2020-01-21
10385295 Compositions for anti pattern collapse treatment comprising gemini additives Andrei Honciuc, Guenter Oetter, Christian Bittner 2019-08-20
9891520 Use of surfactants having at least three short-chain perfluorinated groups in formulations for photo mask cleaning Andrei Honciuc, Chu-Ya Yang 2018-02-13
9557652 Use of compositions comprising a surfactant and a hydrophobizer for avoiding anti pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below Andrei Honciuc, Günter Oetter, Christian Bittner 2017-01-31
9484218 Post ion implant stripper for advanced semiconductor application ChienShin Chen, MeiChin Shen, ChiaHao Chan 2016-11-01
9275851 Aqueous, nitrogen-free cleaning composition and its use for removing residues and contaminants from semiconductor substrates suitable for manufacturing microelectronic devices Vijay Immanuel Raman, Shyam Sundar Venkataraman, Raimund Mellies, Mingjie Zhong 2016-03-01
9236256 Use of surfactants having at least three short-chain perfluorinated groups RF for manufacturing integrated circuits having patterns with line-space dimensions below 50 NM Dieter Mayer 2016-01-12
9223221 Photoresist stripping and cleaning composition, method of its preparation and its use Simon Braun, Christian Bittner 2015-12-29
9184057 Method for manufacturing integrated circuit devices, optical devices, micromachines and mechanical precision devices having patterned material layers with line-space dimensions of 50 nm and less Guenter Oetter, Sabrina Montero Pancera, Andrei Honciuc, Christian Bittner 2015-11-10
9146471 Resist stripping compositions and methods for manufacturing electrical devices 2015-09-29
9005367 Resist stripping compositions and methods for manufacturing electrical devices 2015-04-14
8969275 Aqueous alkaline cleaning compositions and methods of their use Raimund Mellies 2015-03-03
8927476 Aqueous alkaline cleaning compositions and methods of their use Raimund Mellies 2015-01-06
8901000 Aqueous acidic solution and etching solution and method for texturizing the surface of single crystal and polycrystal silicon substrates Simon Braun, Cornelia Roeger-Goepfert, Christian Bittner, MeiChin Shen, Chengwei Lin 2014-12-02