Issued Patents All Time
Showing 176–200 of 211 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8379991 | Delta TCC for fast sensitivity model computation | Jun Ye, Wenjin Shao, Hua Cao | 2013-02-19 |
| 8352885 | Three-dimensional mask model for photolithography simulation | Peng Liu, Luoqi Chen, Jun Ye | 2013-01-08 |
| 8245160 | System and method for creating a focus-exposure model of a lithography process | Jun Ye, Luoqi Chen, Hua-Yu Liu | 2012-08-14 |
| 8209640 | System and method for lithography simulation | Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen | 2012-06-26 |
| 8200468 | Methods and system for lithography process window simulation | Jun Ye, Hanying Feng | 2012-06-12 |
| 8065636 | System and method for creating a focus-exposure model of a lithography process | Jun Ye, Luoqi Chen, Hua-Yu Liu | 2011-11-22 |
| 8056028 | Method of performing mask-writer tuning and optimization | James Wiley, Jun Ye | 2011-11-08 |
| 8041611 | Pricing and auctioning of bundled items among multiple sellers and buyers | Leonard Kleinrock | 2011-10-18 |
| 7999920 | Method of performing model-based scanner tuning | Jun Ye | 2011-08-16 |
| 7974972 | Methods and apparatus for searching with awareness of geography and languages | — | 2011-07-05 |
| 7882480 | System and method for model-based sub-resolution assist feature generation | Jun Ye, Hanying Feng | 2011-02-01 |
| 7873937 | System and method for lithography simulation | Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen | 2011-01-18 |
| 7840447 | Pricing and auctioning of bundled items among multiple sellers and buyers | Leonard Kleinrock | 2010-11-23 |
| 7809610 | Methods and apparatus for freshness and completeness of information | — | 2010-10-05 |
| 7749666 | System and method for measuring and analyzing lithographic parameters and determining optimal process corrections | Michael Gassner, Stefan Hunsche, Jun Ye, Moshe E. Preil | 2010-07-06 |
| 7747978 | System and method for creating a focus-exposure model of a lithography process | Jun Ye, Luoqi Chen, Hua-Yu Liu | 2010-06-29 |
| 7703069 | Three-dimensional mask model for photolithography simulation | Peng Liu, Luogi Chen, Jun Ye | 2010-04-20 |
| 7571106 | Methods and apparatus for freshness and completeness of information | Leonard Kleinrock | 2009-08-04 |
| 7558419 | System and method for detecting integrated circuit pattern defects | Jun Ye, R. Fabian W. Pease | 2009-07-07 |
| 7523108 | Methods and apparatus for searching with awareness of geography and languages | — | 2009-04-21 |
| 7499156 | Closed region defect detection system | George Chen, Lih-Huah Yiin | 2009-03-03 |
| 7488933 | Method for lithography model calibration | Jun Ye, Guangqing Chen, Stefan Hunsche | 2009-02-10 |
| 7483894 | Methods and apparatus for entity search | — | 2009-01-27 |
| 7126681 | Closed region defect detection system | George Chen, Lih-Huah Yiin | 2006-10-24 |
| 7120895 | System and method for lithography simulation | Jun Ye, Yen-Wen Lu, Luoqi Chen, Xun Chen | 2006-10-10 |